Effective Channel Mobility Extraction and Modeling of 10-nm Bulk CMOS FinFETs in Cryogenic Temperature Operation for Quantum Computing Applications
Gupta, Sumreti, Singh, Sujit Kumar, Vega, Reinaldo A., Dixit, Abhisek
Published in IEEE transactions on electron devices (01.04.2023)
Published in IEEE transactions on electron devices (01.04.2023)
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Journal Article
Compact Model of a Bulk FinFET Quantum Dot Toward Single Chip Integration of Qubits and Control Electronics for Quantum Computing Applications
Singh, Sujit Kumar, Sharma, Deepesh, Vega, Reinaldo A., Dixit, Abhisek
Published in IEEE transactions on electron devices (01.06.2023)
Published in IEEE transactions on electron devices (01.06.2023)
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Journal Article
Study of Random Dopant Fluctuation Effects in Germanium-Source Tunnel FETs
Damrongplasit, N., Changhwan Shin, Sung Hwan Kim, Vega, R. A., Tsu-Jae King Liu
Published in IEEE transactions on electron devices (01.10.2011)
Published in IEEE transactions on electron devices (01.10.2011)
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Journal Article
Chip Power-Frequency Scaling in 10/7nm Node
Oldiges, Phil, Vega, Reinaldo, Utomo, Henry K., Lanzillo, Nick A., Wassick, Thomas, Li, Juntao, Wang, Junli, Shahidi, Ghavam G.
Published in IEEE access (01.01.2020)
Published in IEEE access (01.01.2020)
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Journal Article
Impact of Hot Carrier Stress on RF FOMs in 10-nm Bulk N-Channel FinFETs
Gupta, Anshul, Gupta, Charu, Vega, Reinaldo A., Dixit, Abhisek
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2019)
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2019)
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Conference Proceeding
The Effect of Random Dopant Fluctuation on Specific Contact Resistivity
Vega, R.A., Lee, V.C., Tsu-Jae King Liu
Published in IEEE transactions on electron devices (01.01.2010)
Published in IEEE transactions on electron devices (01.01.2010)
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Journal Article