HIGH SPEED QUANTUM EFFICIENCY MEASUREMENT APPARATUS UTILIZING SOLID STATE LIGHTSOURCE
HORNER GREGORY S, KLEIN DAVID L, VASILYEV LEONID A, SCHMIDT JOHN M, HUDSON JAMES E, ARBORE MARK A
Year of Publication 16.11.2011
Get full text
Year of Publication 16.11.2011
Patent
Electroluminescence Excitation Spectroscopy: A Novel Approach to Non-Contact Quantum Efficiency Measurements
Davis, Kristopher O., Horner, Greg S., Gallon, Joshua B., Vasilyev, Leonid A., Lu, Kyle B., Dirriwachter, Antonius B., Rigdon, Terry B., Schneller, Eric J., Ogutman, Kortan, Ahrenkiel, Richard K.
Published in 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) (01.06.2017)
Published in 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) (01.06.2017)
Get full text
Conference Proceeding
High speed detection of shunt defects in photovoltaic and optoelectronic devices
Vasilyev, Leonid A, Schmidt, John M, Hudson, James E, Horner, Gregory S
Year of Publication 02.10.2012
Get full text
Year of Publication 02.10.2012
Patent
High speed quantum efficiency measurement apparatus utilizing solid state lightsource
HORNER GREGORY S, KLEIN DAVID L, VASILYEV LEONID A, SCHMIDT JOHN M, HUDSON JAMES E, ARBORE MARK A
Year of Publication 30.10.2012
Get full text
Year of Publication 30.10.2012
Patent
High speed quantum efficiency measurement apparatus utilizing solid state lightsource
Arbore, Mark A, Klein, David L, Vasilyev, Leonid A, Schmidt, John M, Hudson, James E, Horner, Gregory S
Year of Publication 30.10.2012
Get full text
Year of Publication 30.10.2012
Patent
HIGH SPEED DETECTION OF SHUNT DEFECTS IN PHOTOVOLTAIC AND OPTOELECTRONIC DEVICES
VASILYEV, LEONID, A, HUDSON, JAMES, E, HORNER, GREGORY, S, SCHMIDT, JOHN, M
Year of Publication 12.08.2010
Get full text
Year of Publication 12.08.2010
Patent
High speed quantum efficiency measurement apparatus utilizing solid state lightsource
HORNER GREGORY S, KLEIN DAVID L, VASILYEV LEONID A, SCHMIDT JOHN M, HUDSON JAMES E, ARBORE MARK A
Year of Publication 02.09.2010
Get full text
Year of Publication 02.09.2010
Patent
SCHICHTDICKENMESSUNG MITTELS INELASTISCHER ELEKTRONENSTREUUNG
BRYSON, CHARLES, E., III, LINDER, ROBERT, KI YACHKO, DMITRI, VASILYEV, LEONID, A, BORODYANSKY, SERGEY
Year of Publication 15.04.2005
Get full text
Year of Publication 15.04.2005
Patent
MEASUREMENT OF FILM THICKNESS BY INELASTIC ELECTRON SCATTERING
BRYSON, CHARLES, E., III, LINDER, ROBERT, KI YACHKO, DMITRI, VASILYEV, LEONID, A, BORODYANSKY, SERGEY
Year of Publication 23.03.2005
Get full text
Year of Publication 23.03.2005
Patent
Measurement of film thickness by inelastic electron scattering
KLYACHKO DMITRI, VASILYEV LEONID A, LINDER ROBERT, BORODYANSKY SERGEY, BRYSON, III CHARLES E
Year of Publication 04.06.2002
Get full text
Year of Publication 04.06.2002
Patent
Measurement of film thickness by inelastic electron scattering
Vasilyev, Leonid A, Bryson, III, Charles E, Linder, Robert, Borodyansky, Sergey, Klyachko, Dmitri
Year of Publication 04.06.2002
Get full text
Year of Publication 04.06.2002
Patent
MEASUREMENT OF FILM THICKNESS BY INELASTIC ELECTRON SCATTERING
BRYSON, CHARLES, E., III, LINDER, ROBERT, KI YACHKO, DMITRI, VASILYEV, LEONID, A, BORODYANSKY, SERGEY
Year of Publication 03.04.2002
Get full text
Year of Publication 03.04.2002
Patent