Golden Gates: A New Hybrid Approach for Rapid Hardware Trojan Detection using Testing and Imaging
Shi, Qihang, Vashistha, Nidish, Lu, Hangwei, Shen, Haoting, Tehranipoor, Bahar, Woodard, Damon L, Asadizanjani, Navid
Published in 2019 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) (01.05.2019)
Published in 2019 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) (01.05.2019)
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Conference Proceeding
Detecting Hardware Trojans Using Combined Self-Testing and Imaging
Vashistha, Nidish, Lu, Hangwei, Shi, Qihang, Woodard, Damon L., Asadizanjani, Navid, Tehranipoor, Mark M.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2022)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2022)
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Journal Article
eChain: A Blockchain-Enabled Ecosystem for Electronic Device Authenticity Verification
Vashistha, Nidish, Hossain, Muhammad Monir, Shahriar, Md Rakib, Farahmandi, Farimah, Rahman, Fahim, Tehranipoor, Mark M.
Published in IEEE transactions on consumer electronics (01.02.2022)
Published in IEEE transactions on consumer electronics (01.02.2022)
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Journal Article
Is Backside the New Backdoor in Modern SoCs?: Invited Paper
Vashistha, Nidish, Rahman, M Tanjidur, Dizon-Paradis, Olivia P., Asadizanjani, Navid
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)
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Conference Proceeding
Detecting Hardware Trojans Inserted by Untrusted Foundry Using Physical Inspection and Advanced Image Processing
Vashistha, Nidish, Rahman, M. Tanjidur, Shen, Haoting, Woodard, Damon L., Asadizanjani, Navid, Tehranipoor, Mark
Published in Journal of hardware and systems security (01.12.2018)
Published in Journal of hardware and systems security (01.12.2018)
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Journal Article
Trust Validation of Chiplets using a Physical Inspection based Certification Authority
Vashistha, Nidish, Al Hasan, Md Mahfuz, Asadizanjani, Navid, Rahman, Fahim, Tehranipoor, Mark
Published in 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) (01.05.2022)
Published in 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) (01.05.2022)
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Conference Proceeding
Generative Adversarial Network for Integrated Circuits Physical Assurance Using Scanning Electron Microscopy
Al Hasan, Md Mahfuz, Vashistha, Nidish, Taheri, Shayan, Tehranipoor, Mark, Asadizanjani, Navid
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding
Digital Twin Aided IC Packaging Structure Analysis for High-quality Sample Preparation
Xi, Chengjie, Khan, Aslam A., True, John, Vashistha, Nidish, Jessurun, Nathan, Asadizanjani, Navid
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding
EVHA: Explainable Vision System for Hardware Testing and Assurance -- An Overview
Hasan, Md Mahfuz Al, Mostafiz, Mohammad Tahsin, Le, Thomas An, Julia, Jake, Vashistha, Nidish, Taheri, Shayan, Asadizanjani, Navid
Year of Publication 19.07.2022
Year of Publication 19.07.2022
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Journal Article
Knowledge-based object localization in images for hardware assurance
Woodard, Damon, Tehranipoor, Mark M, Vashistha, Nidish, Asadi-Zanjani, Navid, Lu, Hangwei, Wilson, Ronald
Year of Publication 24.09.2024
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Year of Publication 24.09.2024
Patent
KNOWLEDGE-BASED OBJECT LOCALIZATION IN IMAGES FOR HARDWARE ASSURANCE
Woodard, Damon, Tehranipoor, Mark M, Vashistha, Nidish, Asadi-Zanjani, Navid, Lu, Hangwei, Wilson, Ronald
Year of Publication 28.04.2022
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Year of Publication 28.04.2022
Patent
Hardware trojan scanner
Tehranipoor, Mark M, Woodard, Damon, Vashistha, Nidish, Rahman, Mir Tanjidur, Asadizanjani, Navid, Shen, Haoting
Year of Publication 08.06.2021
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Year of Publication 08.06.2021
Patent
HARDWARE TROJAN SCANNER
Tehranipoor, Mark M, Woodard, Damon, Vashistha, Nidish, Rahman, Mir Tanjidur, Asadizanjani, Navid, Shen, Haoting
Year of Publication 19.03.2020
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Year of Publication 19.03.2020
Patent
Trojan Scanner: Detecting Hardware Trojans with Rapid SEM Imaging Combined with Image Processing and Machine Learning
ASM International
Published in ISTFA™ 2018 - Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, October 28-November 1, 2018, Phoenix Convention Center, Phoenix, Arizona, USA (2018)
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Published in ISTFA™ 2018 - Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, October 28-November 1, 2018, Phoenix Convention Center, Phoenix, Arizona, USA (2018)
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