by Afzalian, A, Vasen, T, Ramvall, P, Shen, T-M, Wu, J, Passlack, M
Published in Journal of physics. Condensed matter (27.06.2018)

by Vasen, T., Ramvall, P., Afzalian, A., Doornbos, G., Holland, M., Thelander, C., Dick, K. A., Wernersson, L. - E., Passlack, M.
Published in Scientific reports (17.01.2019)

by van Dal, M.J.H., Vellianitis, G., Doornbos, G., Duriez, B., Holland, M.C., Vasen, T., Afzalian, A., Chen, E., Su, S.K., Chen, T.K., Shen, T.M., Wu, Z.Q., Diaz, C.H.
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)

by Yeqing Lu, Guangle Zhou, Rui Li, Qingmin Liu, Qin Zhang, Vasen, T., Soo Doo Chae, Kosel, T., Wistey, M., Huili Xing, Seabaugh, A., Fay, P.
Published in IEEE electron device letters (01.05.2012)

by Guangle Zhou, Yeqing Lu, Rui Li, Qin Zhang, Wan Sik Hwang, Qingmin Liu, Vasen, T., Chen Chen, Haijun Zhu, Jenn-Ming Kuo, Koswatta, S., Kosel, T., Wistey, M., Fay, P., Seabaugh, A., Huili Xing
Published in IEEE electron device letters (01.11.2011)

by Oxland, R, X Li, Chang, S W, Wang, S W, Vasen, T, Ramvall, P, Contreras-Guerrero, R, Rojas-Ramirez, J, Holland, M, Doornbos, G, Chang, Y S, Macintyre, D S, Thoms, S, Droopad, R, Y-C, Yeo, Diaz, C H, Thayne, I G, Passlack, M
Published in IEEE electron device letters (01.03.2016)

by Oxland, R., Li, X., Chang, S. W., Wang, S. W., Vasen, T., Ramvall, P., Contreras-Guerrero, R., Rojas-Ramirez, J., Holland, M., Doornbos, G., Chang, Y. S., Macintyre, D. S., Thoms, S., Droopad, R., Yeo, Y.-C, Diaz, C. H., Thayne, I. G., Passlack, M.
Published in IEEE electron device letters (01.03.2016)

by Oxland, R., Li, X., Chang, S. W., Wang, S. W., Vasen, T., Ramvall, P., Contreras-Guerrero, R., Rojas-Ramirez, J., Holland, M., Doornbos, G., Chang, Y. S., Macintyre, D. S., Thoms, S., Droopad, R., Yeo, Y.-C., Diaz, C. H., Thayne, I. G., Passlack, M.
Published in IEEE electron device letters (01.03.2016)

by Passlack, M., Ramvall, P., Vasen, T., Afzalian, A., Thelander, C., Dick, K.A., Wernersson, L.-E., Doornbos, G., Holland, M.
Published in 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2019)

by Vasen, T., Ramvall, P., Afzalian, A., Thelander, C., Dick, K. A., Holland, M., Doornbos, G., Wang, S. W., Oxland, R., Vellianitis, G., van Dal, M. J. H., Duriez, B., Ramirez, J.-R, Droopad, R., Wernersson, L.-E, Samuelson, L., Chen, T.-K, Yeo, Y.-C, Passlack, M.
Published in 2016 IEEE Symposium on VLSI Technology (01.06.2016)

by Guangle Zhou, Yeqing Lu, Rui Li, Qin Zhang, Qingmin Liu, Vasen, T., Haijun Zhu, Jenn-Ming Kuo, Kosel, T., Wistey, M., Fay, P., Seabaugh, A., Huili Xing
Published in IEEE electron device letters (01.06.2012)

by Rui Li, Yeqing Lu, Guangle Zhou, Qingmin Liu, Soo Doo Chae, Vasen, T., Wan Sik Hwang, Qin Zhang, Fay, P., Kosel, T., Wistey, M., Huili Xing, Seabaugh, A.
Published in IEEE electron device letters (01.03.2012)

by Guangle Zhou, Lu, Y., Li, R., Zhang, Q., Hwang, W., Liu, Q., Vasen, T., Zhu, H., Kuo, J., Koswatta, S., Kosel, T., Wistey, M., Fay, P., Seabaugh, A., Huili Xing
Published in 69th Device Research Conference (01.06.2011)

by Seabaugh, Alan, Chae, Soo Doo, Fay, Patrick, Hwang, Wan Sik, Kosel, Tom, Li, Rui, Liu, Qingmin, Lu, Yeqing, Vasen, Tim, Wistey, Mark, Xing, Grace (Huili), Zhou, Guangle, Zhang, Qin
Published in ECS transactions (01.01.2011)

by Hendriks, Yvonne M.C, de Jong, Andrea E, Morreau, Hans, Tops, Carli M.J, Vasen, Hans F, Wijnen, Juul Th, Breuning, Martijn H, Brocker-Vriends, Annette H.J.T
Published in CA: a cancer journal for clinicians (01.07.2006)

by Chang, S. W., Li, Xu, Oxland, R., Wang, S. W., Wang, C. H., Contreras-Guerrero, R., Bhuwalka, K. K., Doornbos, G., Vasen, T., Holland, M. C., Vellianitis, G., van Dal, M. J. H., Duriez, B., Edirisooriya, M., Rojas-Ramirez, J. S., Ramvall, P., Thoms, S., Peralagu, U., Hsieh, C. H., Chang, Y. S., Yin, K. M., Lind, E., Wernersson, L.-E, Droopad, R., Thayne, I., Passlack, M., Diaz, C. H.
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)

by Zhou, Guangle, Kosel, T., Wistey, M., Fay, P., Seabaugh, A., Xing, Huili, Li, R., Vasen, T., Qi, M., Chae, S., Lu, Y., Zhang, Q., Zhu, H., Kuo, J.-M.
Published in 2012 International Electron Devices Meeting (01.12.2012)

by Chang, S W, Li, Xu, Oxland, R, Wang, S W, Wang, CH, Contreras-Guerrero, R, Bhuwalka, K K, Doornbos, G, Vasen, T, Holland, M C, Vellianitis, G, van Dal, MJH, Duriez, B, Edirisooriya, M, Rojas-Ramirez, J S, Ramvall, P, Thoms, S, Peralagu, U, Hsieh, CH, Chang, Y S, Yin, K M, Lind, E, Wernersson, L-E, Droopad, R, Thayne, I, Passlack, M, Diaz, CH
Published in Technical digest - International Electron Devices Meeting (01.12.2013)

by Kabeer, S., Vasen, T., Wheeler, D., Qin Zhang, Koswatta, S., Haijun Zhu, Clark, K., Jenn-Ming Kuo, Yung-Chung Kao, Corcoran, S., Doyle, B., Fay, P., Kosel, T., Huili Xing, Seabaugh, A.
Published in 2009 International Semiconductor Device Research Symposium (01.12.2009)

by Wheeler, D., Kabeer, S., Yeqing Lu, Vasen, T., Qin Zhang, Guangle Zhou, Clark, K., Haijun Zhu, Yung-Chung Kao, Fay, P., Kosel, T., Huili Xing, Seabaugh, A.
Published in 2009 International Semiconductor Device Research Symposium (01.12.2009)