Carbon Vacancy Assisted Contact Resistance Engineering in Graphene FETs
Kumar, Jeevesh, Meersha, Adil, Variar, Harsha B., Mishra, Abhishek, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.04.2022)
Published in IEEE transactions on electron devices (01.04.2022)
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Journal Article
Vacancy Assisted Bilayer Graphene Contact for Monolayer Graphene Channel Devices
Meersha, Adil, Kumar, Jeevesh, Mishra, Abhishek, Variar, Harsha B., Shrivastava, Mayank
Published in IEEE electron device letters (01.04.2023)
Published in IEEE electron device letters (01.04.2023)
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Journal Article
Chalcogen-Assisted Enhanced Atomic Orbital Interaction at TMD-Metal Interface and Sulfur Passivation for Overall Performance Boost of 2-D TMD FETs
Ansh, Shrivastava, Mayank, Kumar, Jeevesh, Sheoran, Gaurav, Variar, Harsha B., Mishra, Ravikesh, Kuruva, Hemanjaneyulu, Meersha, Adil, Mishra, Abhishek, Raghavan, Srinivasan
Published in IEEE transactions on electron devices (01.02.2020)
Published in IEEE transactions on electron devices (01.02.2020)
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Journal Article
Unified Mechanism for Graphene FET's Electrothermal Breakdown and Its Implications on Safe Operating Limits
Mishra, Abhishek, Meersha, Adil, Kranthi, N. K., Kumar, Jeevesh, Bellamkonda, N. S. Veenadhari, Variar, Harsha B., Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.05.2021)
Published in IEEE transactions on electron devices (01.05.2021)
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Journal Article
Circuit Reliability of \text Channel Based 2D Transistors
Rai, Anand Kumar, Variar, Harsha B., Shrivastava, Mayank
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices
Kumar, Jeevesh, Kuruva, Hemanjaneyulu, Variar, Harsha B., Patbhaje, Utpreksh, Shrivastava, Mayank
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
3D Approaches to Engineer Holding Voltage of SCR
Gautam, Satendra Kumar, Variar, Harsha B, Luo, Juan, Shi, Ning, Marreiro, David, Mallikarjunaswamy, Shekar, Shrivastava, Mayank
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept
Variar, Harsha B, Gautam, Satendra Kumar, Kumar, Ashita, Amogh, K M, Luo, Juan, Shi, Ning, Marreiro, David, Mallikarjunaswamy, Shekar, Shrivastava, Mayank
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Physical Insights Into the ESD Behavior of Field Plated UHV LDMOS Devices
Variar, Harsha B, Somayaji, Jhnanesh, Shrivastava, Mayank
Published in 2022 IEEE International Conference on Emerging Electronics (ICEE) (11.12.2022)
Published in 2022 IEEE International Conference on Emerging Electronics (ICEE) (11.12.2022)
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Conference Proceeding
Performance and Reliability Co-design of Ultra High Voltage LDMOS Devices
Variar, Harsha B, Somayaji, Jhnanesh, Shrivastava, Mayank
Published in 2022 IEEE International Conference on Emerging Electronics (ICEE) (11.12.2022)
Published in 2022 IEEE International Conference on Emerging Electronics (ICEE) (11.12.2022)
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Conference Proceeding
Exploring the Feasibility of AlN/GaN HEMTs for THz Applications Using a Novel Device-Circuit Co-Design Approach
Variar, Harsha B, Singh, Ajay, Soni, Ankit, Shrivastava, Mayank
Published in 2022 IEEE International Conference on Emerging Electronics (ICEE) (11.12.2022)
Published in 2022 IEEE International Conference on Emerging Electronics (ICEE) (11.12.2022)
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Conference Proceeding
Comprehensive Computational Modelling Approach for Graphene FETs
Hemanjaneyulu, Kuruva, Khaneja, Mamta, Meersha, Adil, Variar, Harsha B, Shrivastava, Mayank
Published in 2018 4th IEEE International Conference on Emerging Electronics (ICEE) (01.12.2018)
Published in 2018 4th IEEE International Conference on Emerging Electronics (ICEE) (01.12.2018)
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Conference Proceeding
Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs
Kranthi, N. K., Mishra, Abhishek, Meersha, Adil, Variar, Harsha B., Shrivastava, Mayank
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding
First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects
Mishra, Abhishek, Meersha, Adil, Kranthi, N.K., Trivedi, Kruti, Variar, Harsha B., Veenadhari Bellamkonda, N S, Raghavan, Srinivasan, Shrivastava, Mayank
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
ESD Behavior of Fin based Tunnel FETs
Variar, Harsha B, Kranthi, Nagothu Karmel, Kuruva, Hemanjaneyulu, Shrivastava, Mayank
Published in 2022 IEEE International Conference on Emerging Electronics (ICEE) (11.12.2022)
Published in 2022 IEEE International Conference on Emerging Electronics (ICEE) (11.12.2022)
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Conference Proceeding
Chalcogen Assisted Enhanced Atomic Orbital Interaction at TMDs - Metal Interface & Chalcogen Passivation of TMD Channel For Overall Performance Boost of 2D TMD FETs
Ansh, Kumar, Jeevesh, Sheoran, Gaurav, Variar, Harsha B, Mishra, Ravi K, Kuruva, Hemanjaneyulu, Meersha, Adil, Mishra, Abhishek, Raghavan, Srinivasan, Shrivastava, Mayank
Published in arXiv.org (08.01.2019)
Published in arXiv.org (08.01.2019)
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Journal Article