Ellipsometry: a technique for real time monitoring and analysis of MBE-grown CdHgTe and CdTe/HgTe superlattices
Hartley, R.H., Folkard, M.A., Carr, D., Orders, P.J., Rees, D., Varga, I.K., Kumar, V., Shen, G., Steele, T.A., Buskes, H., Lee, J.B.
Published in Journal of crystal growth (01.02.1992)
Published in Journal of crystal growth (01.02.1992)
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Conference Proceeding
In-situ ellipsometric measurements of the MBE growth of CdTe/HgTe and CdTe/ZnTe superlattices
FOLKARD, M. A, SHEN, G, HARTLEY, R. H, BUSKES, H, GAL, M, KUMAR, V, STEELE, T. A, REES, D, VARGA, I. K, CARR, D, FUELOEP, K, JOHNSON, B. A, ORDERS, P. J
Published in Journal of electronic materials (01.08.1993)
Published in Journal of electronic materials (01.08.1993)
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Conference Proceeding
Journal Article
Phase modulated ellipsometry used for composition control during MBE growth of CdHgTe : An analysis of instrumental factors and an assessment of the material produced
HARTLEY, R. H, FOLKARD, M. A, CAPPER, P, DUTTON, D, BARTON, S, GALE, I, GRAINGER, F, CARR, D, ORDERS, P. J, SHEN, G, KUMAR, V, STEELE, T. A, VARGA, I. K, JOHNSON, B. A, FUELOOP, K
Published in Journal of electronic materials (01.09.1996)
Published in Journal of electronic materials (01.09.1996)
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