Non-intrusive detection of defects in mixed-signal integrated circuits using light activation
Esen, Baris, Coyette, Anthony, Xama, Nektar, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges
Published in 2017 IEEE International Test Conference (ITC) (01.10.2017)
Published in 2017 IEEE International Test Conference (ITC) (01.10.2017)
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Conference Proceeding
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs using SVM Classifiers
Xama, Nektar, Gomez, Jhon, Dobbelaere, Wim, Vanhooren, Ronny, Coyette, Anthony, Gielen, Georges
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.2023)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.2023)
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Journal Article
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value
Gomez, Jhon, Xama, Nektar, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2022)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2022)
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Journal Article
Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing
Gomez, Jhon, Xama, Nektar, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges
Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01.04.2020)
Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01.04.2020)
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Conference Proceeding
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs
Dobbelaere, Wim, Colle, Frederik, Coyette, Anthony, Vanhooren, Ronny, Xama, Nektar, Gomez, Jhon, Gielen, Georges
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)
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Conference Proceeding
Effective DC fault models and testing approach for open defects in analog circuits
Esen, Baris, Coyette, Anthony, Gielen, Georges, Dobbelaere, Wim, Vanhooren, Ronny
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs
Sunter, Stephen, Wolinski, Michal, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Xama, Nektar, Gomez, Jhon, Gielen, Georges
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Automated testing of mixed-signal integrated circuits by topology modification
Coyette, Anthony, Esen, Baris, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges
Published in 2015 IEEE 33rd VLSI Test Symposium (VTS) (01.04.2015)
Published in 2015 IEEE 33rd VLSI Test Symposium (VTS) (01.04.2015)
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Conference Proceeding
Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis
Coyette, Anthony, Esen, Baris, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
Analog fault coverage improvement using final-test dynamic part average testing
Dobbelaere, Wim, Vanhooren, Ronny, De Man, Willy, Matthijs, Koen, Coyette, Anthony, Esen, Baris, Gielen, Georges
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems
Gielen, Georges, Esen, Baris, Dobbelaer, Wim, Vanhooren, Ronny, Coyette, Anthony, Xama, Nektar
Published in 2018 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2018)
Published in 2018 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2018)
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Conference Proceeding
Practical random sampling of potential defects for analog fault simulation
Sunter, Stephen, Jurga, Krzysztof, Dingenen, Peter, Vanhooren, Ronny
Published in 2014 International Test Conference (01.10.2014)
Published in 2014 International Test Conference (01.10.2014)
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Conference Proceeding
Design and test of analog circuits towards sub-ppm level
Gielen, Georges, Dobbelaere, Wim, Vanhooren, Ronny, Coyette, Anthony, Esen, Baris
Published in 2014 International Test Conference (01.10.2014)
Published in 2014 International Test Conference (01.10.2014)
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Conference Proceeding
High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis
Gomez, Jhon, Xama, Nektar, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges
Published in 2023 IEEE European Test Symposium (ETS) (22.05.2023)
Published in 2023 IEEE European Test Symposium (ETS) (22.05.2023)
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Conference Proceeding
Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing
Coyette, Anthony, Dobbelaere, Wim, Vanhooren, Ronny, Xama, Nektar, Gomez, Jhon, Gielen, Georges
Published in 2020 IEEE European Test Symposium (ETS) (01.05.2020)
Published in 2020 IEEE European Test Symposium (ETS) (01.05.2020)
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Conference Proceeding
Automatic testing of analog ICs for latent defects using topology modification
Xama, Nektar, Coyette, Anthony, Esen, Baris, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges
Published in 2017 22nd IEEE European Test Symposium (ETS) (01.05.2017)
Published in 2017 22nd IEEE European Test Symposium (ETS) (01.05.2017)
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Conference Proceeding
Automatic generation of autonomous built-in observability structures for analog circuits
Coyette, Anthony, Esen, Baris, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges
Published in 2015 20th IEEE European Test Symposium (ETS) (01.05.2015)
Published in 2015 20th IEEE European Test Symposium (ETS) (01.05.2015)
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Conference Proceeding
A very low cost and highly parallel DfT method for analog and mixed-signal circuits
Esen, Baris, Coyette, Anthony, Xama, Nektar, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges
Published in 2017 22nd IEEE European Test Symposium (ETS) (01.05.2017)
Published in 2017 22nd IEEE European Test Symposium (ETS) (01.05.2017)
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Conference Proceeding