Statistical fault injection: Quantified error and confidence
Leveugle, R., Calvez, A., Maistri, P., Vanhauwaert, P.
Published in 2009 Design, Automation & Test in Europe Conference & Exhibition (01.04.2009)
Published in 2009 Design, Automation & Test in Europe Conference & Exhibition (01.04.2009)
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Conference Proceeding
Menopausia y Terapia Hormonal de la Menopausia Las recomendaciones 2018 de la Unidad de Endocrinología Ginecológica de Clínica Alemana de Santiago -Sociedad Italiana de la Menopausia y la Sociedad Chilena de Endocrinología Ginecológica
Parra, M., Lagos, N., Levancini, M., Villarroel, M., Pizarro, E., Vanhauwaert, P, Velasco, S., Fernadez, M, Gambacciani, M., Biglia, N., Cagnacci, A., Caruso, S., Cicinelli, E., Leo, V. De, Carlo, C. Di, Farris, M., Gambera, A., Guaschino, S., Lanzone, A, Paoletti, AM, Russo, N., Vicariotto, F., Villa, P., Volpe, A., Lavin, P., Lopez, M., Campusano, C., Barriga, P., Brantes, S.
Published in Revista chilena de obstetricia y ginecología (01.11.2018)
Published in Revista chilena de obstetricia y ginecología (01.11.2018)
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Journal Article
Evaluation of SET and SEU effects at multiple abstraction levels
Anghel, L., Leveugle, R., Vanhauwaert, P.
Published in 11th IEEE International On-Line Testing Symposium (2005)
Published in 11th IEEE International On-Line Testing Symposium (2005)
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Conference Proceeding
Using multifunctional standardized stack as universal spintronic technology for IoT
Tahoori, M., Nair, S. M., Bishnoi, R., Senni, S., Mohdad, J., Mailly, F., Torres, L., Benoit, P., Gamatie, A., Nouet, P., Ouattara, F., Sassatelli, G., Jabeur, K., Vanhauwaert, P., Atitoaie, A., Firastrau, I., Di Pendina, G., Prenat, G.
Published in 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2018)
Published in 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2018)
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Conference Proceeding
Evaluation of Register-Level Protection Techniques for the Advanced Encryption Standard by Multi-Level Fault Injections
Maistri, P., Vanhauwaert, P., Leveugle, R.
Published in 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) (01.09.2007)
Published in 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) (01.09.2007)
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Conference Proceeding
IDSM: An improved disjoint signature monitoring scheme for processor behavioral checking
Bergaoui, S., Vanhauwaert, P., Leveugle, R.
Published in 2014 15th Latin American Test Workshop - LATW (01.03.2014)
Published in 2014 15th Latin American Test Workshop - LATW (01.03.2014)
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Conference Proceeding
On error models for RTL security evaluations
Vanhauwaert, P., Maistri, P., Leveugle, R., Papadimitriou, A., Hely, D., Beroulle, V.
Published in 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (01.05.2014)
Published in 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (01.05.2014)
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Conference Proceeding
A new critical variable analysis in processor-based systems
Bergaoui, S., Vanhauwaert, P., Leveugle, R.
Published in 2009 European Conference on Radiation and Its Effects on Components and Systems (01.09.2009)
Published in 2009 European Conference on Radiation and Its Effects on Components and Systems (01.09.2009)
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Conference Proceeding
A Novel Double-Data-Rate AES Architecture Resistant against Fault Injection
Maistri, P., Vanhauwaert, P., Leveugle, R.
Published in Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC 2007) (01.09.2007)
Published in Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC 2007) (01.09.2007)
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Conference Proceeding
Reduced Instrumentation and Optimized Fault Injection Control for Dependability Analysis
Vanhauwaert, P., Leveugle, R., Roche, P.
Published in 2006 IFIP International Conference on Very Large Scale Integration (01.10.2006)
Published in 2006 IFIP International Conference on Very Large Scale Integration (01.10.2006)
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Conference Proceeding
A Flexible SoPC-based Fault Injection Environment
Vanhauwaert, P., Leveugle, R., Roche, P.
Published in 2006 IEEE Design and Diagnostics of Electronic Circuits and systems (2006)
Published in 2006 IEEE Design and Diagnostics of Electronic Circuits and systems (2006)
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Conference Proceeding
Laser-induced fault effects in security-dedicated circuits
Leveugle, R., Maistri, P., Vanhauwaert, P., Lu, F., Di Natale, G., Flottes, M.-L, Rouzeyre, B., Papadimitriou, A., Hely, D., Beroulle, V., Hubert, G., De Castro, S., Dutertre, J.-M, Sarafianos, A., Boher, N., Lisart, M., Damiens, J., Candelier, P., Tavernier, C.
Published in 2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC) (01.10.2014)
Published in 2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC) (01.10.2014)
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Conference Proceeding