Comparison of Epitaxial Graphene on Si-face and C-face 4H SiC Formed by Ultrahigh Vacuum and RF Furnace Production
Jernigan, Glenn G, VanMil, Brenda L, Tedesco, Joseph L, Tischler, Joseph G, Glaser, Evan R, Davidson, Anthony, Campbell, Paul M, Gaskill, D. Kurt
Published in Nano letters (08.07.2009)
Published in Nano letters (08.07.2009)
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Journal Article
Correlating Raman Spectral Signatures with Carrier Mobility in Epitaxial Graphene: A Guide to Achieving High Mobility on the Wafer Scale
Robinson, Joshua A, Wetherington, Maxwell, Tedesco, Joseph L, Campbell, Paul M, Weng, Xiaojun, Stitt, Joseph, Fanton, Mark A, Frantz, Eric, Snyder, David, VanMil, Brenda L, Jernigan, Glenn G, Myers-Ward, Rachael L, Eddy, Charles R, Gaskill, D. Kurt
Published in Nano letters (12.08.2009)
Published in Nano letters (12.08.2009)
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Journal Article
Development and fabrication of extended short wavelength infrared HgCdTe sensors grown on CdTe/Si substrates by molecular beam epitaxy
Simingalam, Sina, VanMil, Brenda L., Chen, Yuanping, DeCuir, Eric A., Meissner, Greg P., Wijewarnasuriya, Priyalal, Dhar, Nibir K., Rao, Mulpuri V.
Published in Solid-state electronics (01.11.2014)
Published in Solid-state electronics (01.11.2014)
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Journal Article
Conference Proceeding
High-Performance Smoothly Tapered Junction Termination Extensions for High-Voltage 4H-SiC Devices
Imhoff, E. A., Kub, F. J., Hobart, K. D., Ancona, M. G., VanMil, B. L., Gaskill, D. K., Lew, K., Myers-Ward, R. L., Eddy, Charles R.
Published in IEEE transactions on electron devices (01.10.2011)
Published in IEEE transactions on electron devices (01.10.2011)
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Journal Article
AlGaN/SiC Heterojunction Ultraviolet Photodiodes
Chen, Yoajia, Reed, Meredith L., Garrett, Gregory A., Vanmil, Brenda L., Chung, Roy B., Shen, H., Sampath, Anand V., Zhou, Q., Wraback, Michael, Enck, Ryan W., Campbell, Joe C.
Published in Materials Science Forum (24.05.2016)
Published in Materials Science Forum (24.05.2016)
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Journal Article
Proton Irradiation of Ultraviolet 4H-SiC Single Photon Avalanche Diodes
Jun Hu, Xiaobin Xin, Zhao, J. H., VanMil, B. L., Myers-Ward, R., Eddy, Charles R., Gaskill, D. K.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Examination of In-Grown Stacking Faults in 8°- and 4°-Offcut 4H-SiC Epitaxy by Photoluminescence Imaging
Liu, Kendrick X., Stahlbush, Robert E., Lew, Kok-Keong, Myers-Ward, Rachael L., VanMil, Brenda L., Gaskill, Kurt D., Eddy, Charles R.
Published in Journal of electronic materials (01.05.2008)
Published in Journal of electronic materials (01.05.2008)
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Journal Article
Improvement of Morphology and Free Carrier Mobility through Argon-Assisted Growth of Epitaxial Graphene on Silicon Carbide
Tedesco, Joseph L., VanMil, Brenda, Myers-Ward, R. L., Culbertson, James, Jernigan, Glenn, Campbell, Paul, McCrate, J M., Kitt, S. A., Eddy, Charles, Gaskill, D. K.
Published in ECS transactions (15.05.2009)
Published in ECS transactions (15.05.2009)
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Journal Article
Large-Area Epitaxial Graphene: Effect of Strain and Thickness on Electronic Properties
Robinson, Joshua, Fanton, Mark, Stitt, T., Snyder, David, Frantz, Eric, Tedesco, Joseph L., VanMil, Brenda, Jernigan, Glenn, Campbell, Paul, Myers-Ward, R. L., Eddy, Charles, Gaskill, D. K.
Published in ECS transactions (01.01.2009)
Published in ECS transactions (01.01.2009)
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Journal Article
Epitaxial-Graphene RF Field-Effect Transistors on Si-Face 6H-SiC Substrates
Moon, J.S., Curtis, D., Hu, M., Wong, D., McGuire, C., Campbell, P.M., Jernigan, G., Tedesco, J.L., VanMil, B., Myers-Ward, R., Eddy, C., Gaskill, D.K.
Published in IEEE electron device letters (01.06.2009)
Published in IEEE electron device letters (01.06.2009)
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Journal Article
NUV-Enhanced 4H-SiC SACM APDs
Schuster, Jonathan, Derenge, Michael A., Smith, Jeremy L., Garrett, Gregory A., Habersat, Daniel B., VanMil, Brenda, Bower, Dina M., Aslam, Shahid, Hewagama, Tilak, Wraback, Michael, Sampath, Anand V.
Published in 2024 Device Research Conference (DRC) (24.06.2024)
Published in 2024 Device Research Conference (DRC) (24.06.2024)
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Conference Proceeding
Exploring the Optical Properties of Hg1−x Cd x Se Films Using IR-Spectroscopic Ellipsometry
Peiris, F.C., Brill, G., Doyle, Kevin, VanMil, Brenda, Myers, Thomas H.
Published in Journal of electronic materials (01.08.2014)
Published in Journal of electronic materials (01.08.2014)
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Journal Article
Exploring the Optical Properties of Hg^sub 1-x^Cd^sub x^Se Films Using IR-Spectroscopic Ellipsometry
Peiris, Fc, Brill, G, Doyle, Kevin, Vanmil, Brenda, Myers, Thomas H
Published in Journal of electronic materials (01.08.2014)
Published in Journal of electronic materials (01.08.2014)
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Journal Article
Exploring the Optical Properties of Hg1−xCdxSe Films Using IR-Spectroscopic Ellipsometry
Peiris, F.C., Brill, G., Doyle, Kevin, VanMil, Brenda, Myers, Thomas H.
Published in Journal of electronic materials (22.05.2014)
Published in Journal of electronic materials (22.05.2014)
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Journal Article
Conference Proceeding
4H-SiC Visible-Blind Single-Photon Avalanche Diode for Ultraviolet Detection at 280 and 350 nm
Jun Hu, Xiaobin Xin, Xueqing Li, Zhao, J.H., VanMil, B.L., Kok-Keong Lew, Myers-Ward, R.L., Eddy, C.R., Gaskill, D.K.
Published in IEEE transactions on electron devices (01.08.2008)
Published in IEEE transactions on electron devices (01.08.2008)
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Journal Article
Spatial Nonuniformity of Photoresponse in SiC UV Avalanche Photodiodes Operating in Linear and Geiger Mode
Habersat, Daniel B, Sampath, Anand, Schuster, Jonathan, Smith, Jeremy, Derenge, Michael, Garrett, Gregory, VanMil, Brenda, Wraback, Michael, Bellotti, Enrico, Zhu, Mike, Ghandi, Reza, Dolinsky, Sergei, Aghayan, Mehrnegar
Published in Meeting abstracts (Electrochemical Society) (09.08.2024)
Published in Meeting abstracts (Electrochemical Society) (09.08.2024)
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Journal Article
Epitaxial Graphene Growth on SiC Wafers
Gaskill, D. K., Jernigan, Glenn, Campbell, Paul, Tedesco, Joseph L., Culbertson, James, VanMil, Brenda, Myers-Ward, R. L., Eddy, Charles, Moon, Jeong, Curtis, D, Hu, M, Wong, D, McGuire, C, Robinson, Joshua, Fanton, Mark, Stitt, T., Snyder, David, Wang, X., Frantz, Eric
Published in ECS transactions (01.01.2009)
Published in ECS transactions (01.01.2009)
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Journal Article
4H-SiC Visible-Blind Single-Photon Avalanche Diode for Ultraviolet Detection at 280 and 350 nm : Silicon carbide devices and technology
JUN HU, XIAOBIN XIN, XUEQING LI, ZHAO, Jian H, VANMIL, Brenda L, LEW, Kok-Keong, MYERS-WARD, Rachael L, EDDY, Charles R, GASKILL, D. Kurt
Published in IEEE transactions on electron devices (2008)
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Published in IEEE transactions on electron devices (2008)
Journal Article
Examination of In-Grown Stacking Faults in 8 deg - and 4 deg -Offcut 4H-SiC Epitaxy by Photoluminescence Imaging
Liu, Kendrick X, Stahlbush, Robert E, Lew, Kok-Keong, Myers-Ward, Rachael L, Vanmil, Brenda L, Gaskill, Kurt D, Eddy, Charles R
Published in Journal of electronic materials (01.05.2008)
Published in Journal of electronic materials (01.05.2008)
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Journal Article