Search Results - "Van den Bogaert, R" :: K.UTB vyhledávací portál

$Detecting the Guttman effect with the help of ordinal correspondence analysis in synchrotron X-ray diffraction data analysis$

Detecting the Guttman effect with the help of ordinal correspondence analysis in synchrotron X-ray diffraction data analysis

by Manté, C., Cornu, S., Borschneck, D., Mocuta, C., van den Bogaert, R.
Published in Journal of applied statistics (25.01.2022)

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Journal Article

by Bossuyt, PJ, Van den Bogaert, R, Scharpe, SL, Van Maercke, Y
Published in Clinical chemistry (Baltimore, Md.) (01.03.1981)

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Journal Article

by Van den Bogaert, R, Joos, P
Published in Journal of physical chemistry (1952) (01.08.1979)

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Journal Article

by Van den Bogaert, R, Joos, P
Published in Journal of physical chemistry (1952) (01.01.1980)

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Journal Article

by R. VAN DEN BOGAERT
Year of Publication 08.09.2004

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Patent

by Bogaert, R.Van Den, Joos, P
Published in Journal of colloid and interface science (01.01.1979)

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Journal Article