Modeling of ultrathin double-gate nMOS/SOI transistors
Francis, P., Terao, A., Flandre, D., Van de Wiele, F.
Published in IEEE transactions on electron devices (01.05.1994)
Published in IEEE transactions on electron devices (01.05.1994)
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Journal Article
Measurement of threshold voltages of thin-film accumulation-mode PMOS/SOI transistors
Terao, A., Flandre, D., Lora-Tamayo, E., Van de Wiele, F.
Published in IEEE electron device letters (01.12.1991)
Published in IEEE electron device letters (01.12.1991)
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Journal Article
Self-aligned silicon-on-insulator nano flash memory device
Tang, X., Baie, X., Colinge, J.P., Crahay, A., Katschmarsyj, B., Scheuren, V., Spôte, D., Reckinger, N., Van de Wiele, F., Bayot, V.
Published in Solid-state electronics (01.12.2000)
Published in Solid-state electronics (01.12.2000)
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Journal Article
Characteristics of nMOS/GAA (Gate-All-Around) transistors near threshold
Francis, P., Terao, A., Flandre, D., Van de Wiele, F.
Published in Microelectronic engineering (1992)
Published in Microelectronic engineering (1992)
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Journal Article
High-accuracy MOS models for computer-aided design
White, M.H., Van De Wiele, F., Lambot, J.-P.
Published in IEEE transactions on electron devices (01.05.1980)
Published in IEEE transactions on electron devices (01.05.1980)
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Journal Article
Measurement of intrinsic gate capacitances of SOI MOSFET's
Flandre, D., Van De Wiele, F., Jespers, P.G.A., Haond, M.
Published in IEEE electron device letters (01.07.1990)
Published in IEEE electron device letters (01.07.1990)
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Journal Article