by Rapuano, Sergio, Vasic, Darko, Van Moer, Wendy
Published in IEEE transactions on instrumentation and measurement (2021)

by Shirmohammadi, Shervin, Daponte, Pasquale, Van Moer, Wendy
Published in IEEE transactions on instrumentation and measurement (01.05.2016)

by Amin, Shoaib, van Moer, Wendy, Handel, Peter, Ronnow, Daniel
Published in IEEE transactions on instrumentation and measurement (01.10.2017)

by Barbe, Kurt, Van Moer, Wendy
Published in IEEE transactions on instrumentation and measurement (01.03.2011)

by Nader, C., Landin, P. N., Van Moer, W., Bjorsell, N., Handel, P., Ronnow, D.
Published in IEEE transactions on microwave theory and techniques (01.11.2012)

by Amin, Shoaib, Van Moer, Wendy, Handel, Peter, Ronnow, Daniel
Published in IEEE transactions on instrumentation and measurement (01.10.2015)

by Slomovitz, Daniel, Van Moer, Wendy, Tellini, Bernardo
Published in IEEE transactions on instrumentation and measurement (01.05.2015)

by Rapuano, Sergio, Van Moer, Wendy
Published in IEEE transactions on instrumentation and measurement (01.07.2012)

by BARBE, Kurt, VAN MOER, Wendy, NAGELS, Guy
Published in IEEE transactions on biomedical engineering (2012)

by Yeary, Mark, Van Moer, Wendy
Published in IEEE transactions on instrumentation and measurement (01.05.2011)

by Moer, Wendy Van
Published in IEEE instrumentation & measurement magazine (01.12.2018)

by Barbe, K., Van Moer, W., Schoors, D.
Published in IEEE transactions on instrumentation and measurement (01.02.2012)

by Moer, Wendy Van
Published in IEEE instrumentation & measurement magazine (01.10.2017)

by Gonzales-Fuentes, Lee, Barbe, Kurt, Van Moer, Wendy, Bjorsell, Niclas
Published in IEEE transactions on instrumentation and measurement (01.12.2013)

by de la O Serna, Jose Antonio, Van Moer, Wendy, Barbe, Kurt
Published in IEEE transactions on instrumentation and measurement (01.10.2013)

by Moer, Wendy Van
Published in IEEE instrumentation & measurement magazine (01.06.2017)

by Van Moer, Wendy, Rolain, Yves
Published in Measurement science & technology (01.01.2010)

by Moer, Wendy Van
Published in IEEE instrumentation & measurement magazine (01.04.2017)

by Moer, Wendy Van
Published in IEEE instrumentation & measurement magazine (01.02.2017)

by Nader, C., Landin, P. N., Van Moer, W., Bjorsell, N., Handel, P.
Published in IEEE transactions on microwave theory and techniques (01.12.2011)