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Small sample corrections for LTS and MCD

by PISON, G, VAN AELST, S, WILLEMS, G
Published in Metrika (01.01.2002)

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Conference Proceeding Journal Article

A robust Hotelling test

by WILLEMS, G, PISON, G, ROUSSEEUW, P. J, VAN AELST, S
Published in Metrika (01.01.2002)

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Conference Proceeding Journal Article