How the trapping of charges can explain the dielectric breakdown performance of alumina ceramics
Liebault, J., Vallayer, J., Goeuriot, D., Treheux, D., Thevenot, F.
Published in Journal of the European Ceramic Society (01.03.2001)
Published in Journal of the European Ceramic Society (01.03.2001)
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Journal Article
Optical and dielectric behaviors of alumina after an electromagnetic irradiation
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Journal Article
Conference Proceeding
Severe wear mechanisms in Al2O3–AlON ceramic composites
Berriche, Y, Vallayer, J, Trabelsi, R, Treheux, D
Published in Journal of the European Ceramic Society (01.08.2000)
Published in Journal of the European Ceramic Society (01.08.2000)
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Journal Article
Limitation induced by electrical charges effects on micromechanisms
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Journal Article
Conference Proceeding
Electromagnetic radiation effect on sapphire charge trapping properties
Vallayer, J, Treheux, D
Published in Materials for Advanced Metallization (MAM), European Workshop (29.06.1998)
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Published in Materials for Advanced Metallization (MAM), European Workshop (29.06.1998)
Journal Article
Severe wear mechanisms in Al 2O 3–AlON ceramic composites
Berriche, Y, Vallayer, J, Trabelsi, R, Treheux, D
Published in Journal of the European Ceramic Society (2000)
Published in Journal of the European Ceramic Society (2000)
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Journal Article
Influence of polishing on the mechanical and dielectric properties of alumina
Vallayer, J, Bigarre, J, Barbier, A, Juve, D, Treheux, D
Published in Materials for Advanced Metallization (MAM), European Workshop (29.06.1998)
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Published in Materials for Advanced Metallization (MAM), European Workshop (29.06.1998)
Journal Article