Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit for LEO Space Applications
Secondo, R., Alia, R. Garcia, Peronnard, P., Brugger, M., Masi, A., Danzeca, S., Merlenghi, A., Vaille, J. R., Dusseau, L.
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Journal Article
Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis
Pouget, V., Jonathas, S., Job, R., Vaillé, J.R., Wrobel, F., Saigné, F.
Published in Microelectronics and reliability (01.09.2017)
Published in Microelectronics and reliability (01.09.2017)
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Journal Article
Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation
Privat, A., Touboul, A. D., Petit, M., Huselstein, J. J., Wrobel, F., Forest, F., Vaillé, J. R., Bourdarie, S., Arinero, R., Chatry, N., Chaumont, G., Lorfèvre, E., Saigné, F.
Published in IEEE transactions on nuclear science (01.08.2014)
Published in IEEE transactions on nuclear science (01.08.2014)
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Journal Article
Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model
Guetarni, K., Touboul, A.D., Boch, J., Foro, L., Privat, A., Michez, A., Vaillé, J.R., Saigné, F.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
Effect of Ion Energy on Power MOSFET's Oxide Reliability
Naceur, M., Touboul, A. D., Vaille, J. R., Lorfevre, E., Bezerra, F., Chaumont, G., Saigne, F.
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
Criterion for SEU occurrence in SRAM deduced from circuit and device Simulations in case of neutron-induced SER
Merelle, T., Chabane, H., Palau, J.-M., Castellani-Coulie, K., Wrobel, F., Saigne, F., Sagnes, B., Boch, J., Vaille, J.R., Gasiot, G., Roche, P., Palau, M.-C., Carriere, T.
Published in IEEE transactions on nuclear science (01.08.2005)
Published in IEEE transactions on nuclear science (01.08.2005)
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Journal Article
Dose Rate Switching Technique on ELDRS-Free Bipolar Devices
Boch, J., Michez, A., Rousselet, M., Dhombres, S., Touboul, A. D., Vaille, J-R, Dusseau, L., Lorfevre, E., Chatry, N., Sukhaseum, N., Saigne, F.
Published in IEEE transactions on nuclear science (01.08.2016)
Published in IEEE transactions on nuclear science (01.08.2016)
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Journal Article
Embedded silicon detector to investigate the natural radiative environment
Pantel, D, Vaille, J R, Wrobel, F, Dilillo, L, Galliere, J M, Autran, J L, Cocquerez, P, Chadoutaud, P, Saigne, F
Published in Journal of instrumentation (01.05.2012)
Published in Journal of instrumentation (01.05.2012)
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Journal Article
Quality control of intensity modulated radiation therapy with optically stimulated luminescent films
Idri, K., Santoro, L., Charpiot, E., Herault, J., Costa, A., Ailleres, N., Delard, R., Vaille, J.R., Fesquet, J., Dusseau, L.
Published in IEEE transactions on nuclear science (01.12.2004)
Published in IEEE transactions on nuclear science (01.12.2004)
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Journal Article
The Living With a Star Space Environment Testbed Payload
Dyer, C.S., Ryden, K.A., Morris, P.A., Hands, A.D.P., McNulty, P.J., Vaille, J-R., Dusseau, L., Cellere, G., Paccagnella, A., Barnaby, H.J., Benedetto, A.R., Velazco, R., Possamai Bastos, R., Brewer, D., Barth, J.L., LaBel, K.A., Campola, M.J., Zheng, Y., Xapsos, M.A.
Published in IEEE transactions on nuclear science (01.03.2023)
Published in IEEE transactions on nuclear science (01.03.2023)
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Journal Article
Modeling and Investigations on TID-ASETs Synergistic Effect in LM124 Operational Amplifier From Three Different Manufacturers
Roig, Fabien, Dusseau, L., Khachatrian, A., Roche, N. J.-H, Privat, A., Vaille, J.-R, Boch, J., Warner, J. H., Saigne, F., Buchner, S. P., McMorrow, D., Ribeiro, P., Auriel, G., Azais, B., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article
Determination of the deposited energy in a silicon volume by n-Si nuclear interaction
Chabane, H., Vaillé, J. R., Mérelle, T., Saigné, F., Dusseau, L., Dumas, M., Palau, J. M., Barelaud, B., Decossas, J. L., Wrobel, F., Buard, N., Palau, M. C.
Published in Journal of applied physics (15.06.2006)
Published in Journal of applied physics (15.06.2006)
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Journal Article
System Level Radiation Characterization of a 1U CubeSat Based on CERN Radiation Monitoring Technology
Secondo, R., Garcia Alia, R., Peronnard, P., Brugger, M., Masi, A., Danzeca, S., Merlenghi, A., Chesta, E., Vaille, J. R., Bernard, M., Dusseau, L.
Published in IEEE transactions on nuclear science (01.08.2018)
Published in IEEE transactions on nuclear science (01.08.2018)
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Journal Article
Study and Modeling of the Impact of TID on the ATREE Response in LM124 Operational Amplifier
Roig, Fabien, Dusseau, L., Ribeiro, P., Auriel, G., Roche, N. J.-H, Privat, A., Vaillé, J.-R, Boch, J., Saigné, F., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R., Azais, B.
Published in IEEE transactions on nuclear science (01.08.2014)
Published in IEEE transactions on nuclear science (01.08.2014)
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Journal Article
Measurement of the Energy Depositions in a Silicon Volume by 14 MeV Neutrons
Chabane, H., Boch, J., Saigne, F., Vaille, J.R., Barelaud, B., Wrobel, F., Calzavara, Y., McNulty, P. J., Decossas, J. L., Garcia, P., Dusseau, L.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
Study of a Thermal Annealing Approach for Very High Total Dose Environments
Dhombres, S., Michez, A., Boch, J., Saigne, F., Beauvivre, S., Kraehenbuehl, D., Vaille, J.-R, Adell, P. C., Lorfevre, E., Ecoffet, R., Roig, F.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
Correlation of In-Flight Displacement Damage on the OSL Sensor With Space Environment On-Board Jason-2 Spacecraft
Bourdarie, S., Falguere, D., Inguimbert, C., Deneau, C., Vaillé, J.-R, Lorfèvre, E., Ecoffet, R.
Published in IEEE transactions on nuclear science (01.08.2014)
Published in IEEE transactions on nuclear science (01.08.2014)
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Journal Article
Benchmarking Ionizing Space Environment Models
Bourdarie, S., Inguimbert, C., Standarovski, D., Vaille, J.-R, Sicard-Piet, A., Falguere, D., Ecoffet, R., Poivey, C., Lorfevre, E.
Published in IEEE transactions on nuclear science (01.08.2017)
Published in IEEE transactions on nuclear science (01.08.2017)
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Journal Article
The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier
Roig, Fabien, Dusseau, L., Ribeiro, P., Auriel, G., Roche, N. J.-H, Privat, A., Vaille, J.-R, Boch, J., Saigne, F., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R., Azais, B.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article