ECR Etching of 10-Boron for Thermal Neutron Detectors
Voss, Lars F., Reinhart, C. E., Graff, R. T., Conway, A. M., Nikolic, R. J., Deo, N., Cheung, C. L.
Published in Meeting abstracts (Electrochemical Society) (01.05.2009)
Published in Meeting abstracts (Electrochemical Society) (01.05.2009)
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Journal Article
METHOD TO PLANARIZE THREE-DIMENSIONAL STRUCTURES TO ENABLE CONFORMAL ELECTRODES
CONWAY ADAM M, SHAO QINGHUI, NIKOLIC REBECCA J, GRAFF ROBERT T, REINHARDT CATHERINE, VOSS LARS F
Year of Publication 23.02.2012
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Year of Publication 23.02.2012
Patent
Electrical Performance and Thermal Stability of Nitride-based Contacts to n- and p-type GaN
Voss, Lars F., Stafford, L., Wright, J.S., Pearton, S.J., Ren, Fan
Published in Meeting abstracts (Electrochemical Society) (01.03.2007)
Published in Meeting abstracts (Electrochemical Society) (01.03.2007)
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Journal Article
THREE-DIMENSIONAL BORON PARTICLE LOADED THERMAL NEUTRON DETECTOR
CONWAY ADAM M, NIKOLIC REBECCA J, HEINECK DANIEL, GRAFF ROBERT T, REINHARDT CATHERINE, VOSS LARS F, CHEUNG CHIN LI, KUNTZ JOSHUA D
Year of Publication 28.03.2013
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Year of Publication 28.03.2013
Patent
Amorphous semiconductor blocking contacts on CdZnTe gamma detectors
Conway, A.M., Sturm, B.W., Voss, L.F., Beck, P.R., Graff, R.T., Nikolic, R.J., Nelson, A.J., Payne, S.A.
Published in 2009 International Semiconductor Device Research Symposium (01.12.2009)
Published in 2009 International Semiconductor Device Research Symposium (01.12.2009)
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Conference Proceeding
Comparison of ZnO Dry Etching in High Density Inductively Coupled CH4/H2 and C2H6/H2-based Chemistries
Lim, Wantae, Pearton, Stephen, Voss, Lars F., Khanna, Rohit, Wright, Jonathan, Gila, Brent, Norton, David, Ren, Fan
Published in Meeting abstracts (Electrochemical Society) (17.02.2006)
Published in Meeting abstracts (Electrochemical Society) (17.02.2006)
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Journal Article
Aging and Stability of GaN High Electron Mobility Transistors and Light-Emitting Diodes With TiB2 - and Ir-Based Contacts
Khanna, R, Stafford, L, Voss, L F, Pearton, S J, Wang, H T, Anderson, T, Hung, Sheng-Chun, Ren, F
Published in IEEE transactions on device and materials reliability (01.06.2008)
Published in IEEE transactions on device and materials reliability (01.06.2008)
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Magazine Article