Design and Simulation of Near-Terahertz GaN Photoconductive Switches-Operation in the Negative Differential Mobility Regime and Pulse Compression
Rakheja, Shaloo, Li, Kexin, Dowling, Karen M., Conway, Adam M., Voss, Lars F.
Published in IEEE journal of the Electron Devices Society (2021)
Published in IEEE journal of the Electron Devices Society (2021)
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Design considerations for three-dimensional betavoltaics
Murphy, John W., Voss, Lars F., Frye, Clint D., Shao, Qinghui, Kazkaz, Kareem, Stoyer, Mark A., Henderson, Roger A., Nikolic, Rebecca J.
Published in AIP advances (01.06.2019)
Published in AIP advances (01.06.2019)
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Journal Article
Performance Modeling of Silicon Carbide Photoconductive Switches for High-Power and High-Frequency Applications
Rakheja, S., Huang, L., Hau-Riege, Stefan, Harrison, S. E., Voss, Lars F., Conway, Adam M.
Published in IEEE journal of the Electron Devices Society (01.01.2020)
Published in IEEE journal of the Electron Devices Society (01.01.2020)
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Simulating charged defects at database scale
Shen, Jimmy-Xuan, Voss, Lars F., Varley, Joel B.
Published in Journal of applied physics (14.04.2024)
Published in Journal of applied physics (14.04.2024)
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A Total Internal Reflection Photoconductive Switch
Bora, Mihail, Voss, Lars F., Grivickas, Paulius V., Hall, David L., Alameda, Jennifer B., Kramer, Noah J., Torres, Andrea M., Conway, Adam M.
Published in IEEE electron device letters (01.05.2019)
Published in IEEE electron device letters (01.05.2019)
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Journal Article
Extrinsic Absorption Pathways in Vanadium‐Doped SiC Measured Using a Total Internal Reflection Geometry
Kramer, Noah J., Voss, Lars F., Conway, Adam M., Grivickas, Paulius V., Bora, Mihail, Hall, David L., Caruso, Anthony N.
Published in Physica status solidi. A, Applications and materials science (01.10.2020)
Published in Physica status solidi. A, Applications and materials science (01.10.2020)
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Journal Article
Demonstration of a Three-Dimensionally Structured Betavoltaic
Murphy, John W., Frye, Clint D., Henderson, Roger A., Stoyer, Mark A., Voss, Lars F., Nikolic, Rebecca J.
Published in Journal of electronic materials (01.03.2021)
Published in Journal of electronic materials (01.03.2021)
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Journal Article
Overview of Wide/Ultrawide Bandgap Power Semiconductor Devices for Distributed Energy Resources
Mazumder, Sudip K., Voss, Lars F., Dowling, Karen M., Conway, Adam, Hall, David, Kaplar, Robert J., Pickrell, Gregory W., Flicker, Jack, Binder, Andrew T., Chowdhury, Srabanti, Veliadis, Victor, Luo, Fang, Khalil, Sameh, Aichinger, Thomas, Bahl, Sandeep R., Meneghini, Matteo, Charles, Alain B.
Published in IEEE journal of emerging and selected topics in power electronics (01.08.2023)
Published in IEEE journal of emerging and selected topics in power electronics (01.08.2023)
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p-i-n High-Speed Photodiodes for X-Ray and Infrared Imagers Fabricated by In Situ-Doped APCVD Germanium Homoepitaxy
Hunt, Charles E., Carpenter, Arthur, Voss, Lars F., Scott, Robin C., Shao, Qinghui, Looker, Quinn, Garafalo, Anne, Mistyuk, Sergey, Durand, Cassandra, Kumar, Ankit, Stroud, Jean-Paul, van Benthem, Klaus
Published in IEEE transactions on electron devices (01.08.2020)
Published in IEEE transactions on electron devices (01.08.2020)
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Journal Article
Hall Effect Characterization of α‐Irradiated p‐Type 4H‐SiC
Frye, Clint D., Murphy, John W., Shao, Qinghui, Voss, Lars F., Harrison, Sara E., Edgar, James H., Nikolić, Rebecca J.
Published in physica status solidi (b) (01.03.2021)
Published in physica status solidi (b) (01.03.2021)
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Journal Article
Radiation Hardness of Si Compared to 4H-SiC for Betavoltaics Assessed by Accelerated Aging Using an Electron Beam System
Shao, Qinghui, Jarrell, Joshua T., Murphy, John M., Frye, Clint D., Henderson, Roger A., Stoyer, Mark A., Voss, Lars F., Nikolic, Rebecca J.
Published in Journal of electronic materials (2022)
Published in Journal of electronic materials (2022)
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Journal Article
Smooth Bosch Etch for Improved Si Diodes
Voss, Lars F., Qinghui Shao, Conway, Adam M., Reinhardt, Cathy E., Graff, Robert T., Nikolic, Rebecca J.
Published in IEEE electron device letters (01.10.2013)
Published in IEEE electron device letters (01.10.2013)
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Journal Article
Thermally Stable Novel Metal Contacts on Bulk, Single-Crystal n-type ZnO
Wright, Jonathan, Khanna, R., Voss, Lars F., Stafford, Luc, Gila, Brent, Norton, David, Pearton, Steve, Ren, Fan, Kravchenko, Ivan I.
Published in ECS transactions (27.04.2007)
Published in ECS transactions (27.04.2007)
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Journal Article
Extrinsic Absorption Pathways in Vanadium‐Doped SiC Measured Using a Total Internal Reflection Geometry
Kramer, Noah J., Voss, Lars F., Conway, Adam M., Grivickas, Paulius V., Bora, Mihail, Hall, David L., Caruso, Anthony N.
Published in Physica status solidi. A, Applications and materials science (01.10.2020)
Published in Physica status solidi. A, Applications and materials science (01.10.2020)
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Journal Article
Radiation Hardness of Si Compared to 4H-SiC for Betavoltaics Assessed by Accelerated Aging Using an Electron Beam System
Shao, Qinghui, Jarrell, Joshua T., Murphy, John M., Frye, Clint D., Henderson, Roger A., Stoyer, Mark A., Voss, Lars F., Nikolic, Rebecca J.
Published in Journal of electronic materials (10.11.2021)
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Published in Journal of electronic materials (10.11.2021)
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