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Year of Publication 23.11.2023
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Year of Publication 16.08.2023
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Year of Publication 09.04.2020
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Year of Publication 20.09.2022
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Defect reduction for 20nm high-k metal gate technology
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Published in 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2015)
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Year of Publication 23.10.2024
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Year of Publication 23.10.2024
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IMAGING REFLECTOMETRY FOR INLINE SCREENING
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Year of Publication 06.12.2023
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Year of Publication 06.12.2023
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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
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Year of Publication 27.09.2023
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Year of Publication 27.09.2023
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IMAGING REFLECTOMETRY FOR INLINE SCREENING
Groos, Thomas, Rathert, Robert J, Donzella, Oreste, Lach, Justin, Price, David W, Robinson, John Charles, Lenox, Chet V, Pandev, Stilian, Von Den Hoff, Mike, Saville, Barry, Li, Shifang
Year of Publication 29.09.2022
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Year of Publication 29.09.2022
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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
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Year of Publication 23.06.2022
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Year of Publication 23.06.2022
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IMAGING REFLECTOMETRY FOR INLINE SCREENING
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Year of Publication 29.09.2022
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Year of Publication 29.09.2022
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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
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Year of Publication 23.06.2022
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Year of Publication 23.06.2022
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Advanced in-line part average testing
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Year of Publication 05.04.2022
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Year of Publication 05.04.2022
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IDENTIFYING NUISANCES AND DEFECTS OF INTEREST IN DEFECTS DETECTED ON A WAFER
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Year of Publication 07.03.2019
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Year of Publication 07.03.2019
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ADVANCED IN-LINE PART AVERAGE TESTING
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Year of Publication 15.07.2021
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Year of Publication 15.07.2021
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ADVANCED IN-LINE PART AVERAGE TESTING
Cappel, Robert, Groos, Thomas, Rathert, Robert J, Donzella, Oreste, Lim, Teng-Song, Price, David W, Hoff, Mike Von Den, Bhatti, Naema, Sutherland, Doug, Sherman, Kara L, Robinson, John Charles, Saville, Barry
Year of Publication 15.07.2021
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Year of Publication 15.07.2021
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Identifying nuisances and defects of interest in defects detected on a wafer
DUFFY, BRIAN, SAH, KAUSHIK, VON DEN HOFF, MIKE, MANI, ANTONIO, CROSS, ANDREW JAMES, PLIHAL, MARTIN
Year of Publication 01.01.2022
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Year of Publication 01.01.2022
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System and method for automatically identifying defect-based test coverage gaps in semiconductor devices
RATHER ROBERT J, GRUSS TOBIAS, VON DEN HOFF MIKE, SAVILLE BRIAN, SHERMAN KAMRAN, DONZELLA OSVALDO, LIN XUANZHENG, LACH JOHANNES, NARASIMHAN NARASIMHAN, ROBINSON JOHN, PRICE DAVID W, LENOX CHRISTIAN
Year of Publication 11.08.2023
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Year of Publication 11.08.2023
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Advanced in-line part average testing
SAVILLE, BARRY, RATHERT, ROBERT J, BHATTI, NAEMA, VON DEN HOFF, MIKE, CAPPEL, ROBERT, SHERMAN, KARA L, PRICE, DAVID W, DONZELLA, ORESTE, SUTHERLAND, DOUG, GROOS, THOMAS, LIM, TENG-SONG, ROBINSON, JOHN CHARLES
Year of Publication 21.03.2024
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Year of Publication 21.03.2024
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