by Voldman, Steven H
Year of Publication 2021

by Gaul, Stephen J, van Vonno, Nicolaas, Voldman, Steven H, Morris, Wesley H
Year of Publication 2019

by Voldman, Steven H
Year of Publication 2009

by Voldman, Steven H
Year of Publication 2012

by Voldman, Steven H
Year of Publication 2015

by Voldman, Steven H
Year of Publication 2011

by Voldman, Steven H
Year of Publication 2015

by Voldman, Steven H
Year of Publication 2013

by Voldman, Steven H
Year of Publication 2012

by Steven H. Voldman
Year of Publication 2019

by Voldman, Steven H.
Published in Frontiers in materials (17.07.2018)

by Voldman, Steven H.
Published in Microelectronics and reliability (01.03.2005)

by Voldman, Steven H
Year of Publication 2015

by Voldman, Steven H.
Published in 2015 IEEE 11th International Conference on ASIC (ASICON) (01.11.2015)

by Voldman, Steven H
Year of Publication 24.04.2015

by Steven H. Voldman
Year of Publication 10.11.2014

by Voldman, Steven H
Published in Journal of semiconductor technology and science (2003)

by Voldman, Steven H.
Published in Microelectronics and reliability (01.02.2005)

by Steven H. Voldman
Published in Engineering and Applied Science Research (EASR) (01.06.2017)

by Wallash, Albert J., Hughbanks, Timothy S., Voldman, Steven H.
Published in Journal of electrostatics (01.10.1996)