Effect of microwave radiation on the properties of Ta2O5–Si microstructures
Atanassova, E., Konakova, R.V., Mitin, V.F., Koprinarova, J., Lytvym, O.S., Okhrimenko, O.B., Schinkarenko, V.V., Virovska, D.
Published in Microelectronics and reliability (01.01.2005)
Published in Microelectronics and reliability (01.01.2005)
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Journal Article
Effect of microwave radiation on the properties of Ta2O5-Si microstructures: Negative-Bias-Temperature Instability (NBTI) in MOS devices special sectio n
ATANASSOVA, E, KONAKOVA, R. V, MITIN, V. F, KOPRINAROVA, J, LYTVYM, O. S, OKHRIMENKO, O. B, SCHINKARENKO, V. V, VIROVSKA, D
Published in Microelectronics and reliability (2005)
Get full text
Published in Microelectronics and reliability (2005)
Journal Article