Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation
Rui Gao, Manut, Azrif B., Zhigang Ji, Jigang Ma, Meng Duan, Jian Fu Zhang, Franco, Jacopo, Hatta, Sharifah Wan Muhamad, Wei Dong Zhang, Kaczer, Ben, Vigar, David, Linten, Dimitri, Groeseneken, Guido
Published in IEEE transactions on electron devices (01.04.2017)
Published in IEEE transactions on electron devices (01.04.2017)
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Insight Into Electron Traps and Their Energy Distribution Under Positive Bias Temperature Stress and Hot Carrier Aging
Meng Duan, Jian Fu Zhang, Zhigang Ji, Wei Dong Zhang, Vigar, David, Asenov, Asen, Gerrer, Louis, Chandra, Vikas, Aitken, Rob, Kaczer, Ben
Published in IEEE transactions on electron devices (01.09.2016)
Published in IEEE transactions on electron devices (01.09.2016)
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Trigger-When-Charged: A Technique for Directly Measuring RTN and BTI-Induced Threshold Voltage Fluctuation Under Use
Manut, Azrif, Gao, Rui, Zhang, Jian Fu, Ji, Zhigang, Mehedi, Mehzabeen, Zhang, Wei Dong, Vigar, David, Asenov, Asen, Kaczer, Ben
Published in IEEE transactions on electron devices (01.03.2019)
Published in IEEE transactions on electron devices (01.03.2019)
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Improving the Accuracy of Modified Shift-and-Ratio Channel Length Extraction Method Using Scanning Capacitance Microscopy
Eng, Chee-Wee, Lau, Wai-Shing, Jiang, Yao-Yao, Vigar, David, Tee, Kheng-Chok, Chan, Lap, Lim, Vanissa Sei-Wei, Trigg, Alastair
Published in Japanese Journal of Applied Physics (01.04.2004)
Published in Japanese Journal of Applied Physics (01.04.2004)
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Addressable test structures for MOSFET variability analysis
Chitrashekaraiah, S., Guo, S., Herberholz, R., Vigar, D., Redford, M.
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)
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