An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults
Narang, Anuraag, Venu, Balaji, Khursheed, Saqib, Harrod, Peter
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
마스킹된-벡터-비교 명령어
VENU BALAJI, EAPEN JACOB, BOTMAN FRANCOIS CHRISTOPHER JACQUES, BOETTCHER MATTHIAS LOTHAR
Year of Publication 30.05.2023
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Year of Publication 30.05.2023
Patent
Error correlation prediction in lockstep processors for safety-critical systems
Ozer, Emre, Venu, Balaji, Iturbe, Xabier, Das, Shidhartha, Lyberis, Spyros, Biggs, John, Harrod, Peter, Penton, John
Published in 2018 51st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO) (20.10.2018)
Published in 2018 51st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO) (20.10.2018)
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Conference Proceeding
An Experimental Study of C-RAN Fronthaul Workload Characteristics: Protocol Choice and Impact on Network Performance
Vinnakota, Venu Balaji, Manne, Naganithin, Mondal, Abhijit, Sen, Debarati, Chakraborty, Sandip
Published in 2019 IEEE 89th Vehicular Technology Conference (VTC2019-Spring) (01.04.2019)
Published in 2019 IEEE 89th Vehicular Technology Conference (VTC2019-Spring) (01.04.2019)
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Conference Proceeding