Compact Modeling of Statistical BTI Under Trapping/Detrapping
Bhaskarr Velamala, Jyothi, Sutaria, Ketul B., Shimizu, Hirofumi, Awano, Hiromitsu, Sato, Takashi, Wirth, Gilson, Yu Cao
Published in IEEE transactions on electron devices (01.11.2013)
Published in IEEE transactions on electron devices (01.11.2013)
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Journal Article
A Physical Unclonable Function Leveraging Hot Carrier Injection Aging
Parker, Rachael J., Velamala, Jyothi Bhaskarr A., Shen, Kuan-Yueh James, Johnston, David, Chang, Yao-Feng, Ramey, Stephen M., Wu, Siang-Jhih Sean, Penmatsa, Padma
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
HOT CARRIER INJECTION PROGRAMMING AND SECURITY
KULKARNI SARVESH, BUTZEN NICOLAS, PARKER RACHAEL, CHAO YU LIN, VELAMALA JYOTHI BHASKARR, CHEN ZHANPING
Year of Publication 06.10.2023
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Year of Publication 06.10.2023
Patent
PVT Tolerant Zero Bit-Error-Rate Physical Unclonable Function Exploiting Hot Carrier Injection Aging in 7nm FinFET Technology
Velamala, Jyothi Bhaskarr, Wu, Siang-jhih Sean, Penmatsa, Padma, Shen, Kuan-Yueh James, Johnston, David, Parker, Rachael
Published in 2022 IEEE Custom Integrated Circuits Conference (CICC) (01.04.2022)
Published in 2022 IEEE Custom Integrated Circuits Conference (CICC) (01.04.2022)
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Conference Proceeding
Physics matters: statistical aging prediction under trapping/detrapping
Velamala, Jyothi Bhaskarr, Sutaria, Ketul, Sato, Takashi, Cao, Yu
Published in DAC Design Automation Conference 2012 (03.06.2012)
Published in DAC Design Automation Conference 2012 (03.06.2012)
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Conference Proceeding
HOT CARRIER INJECTION PROGRAMMING AND SECURITY
Kulkarni, Sarvesh, Chao, Yu-Lin, Velamala, Jyothi Bhaskarr, Parker, Rachael, Chen, Zhanping
Year of Publication 25.05.2023
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Year of Publication 25.05.2023
Patent
HOT CARRIER INJECTION PROGRAMMING AND SECURITY
VELAMALA, Jyothi Bhaskarr, CHEN, Zhanping, PARKER, Rachael, KULKARNI, Sarvesh, CHAO, Yu-Lin
Year of Publication 24.05.2023
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Year of Publication 24.05.2023
Patent
Failure diagnosis of asymmetric aging under NBTI
Velamala, J. B., Ravi, V., Cao, Y.
Published in 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2011)
Published in 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2011)
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Conference Proceeding
Failure Analysis of Asymmetric Aging Under NBTI
Velamala, J. B., Sutaria, K. B., Ravi, V. S., Yu Cao
Published in IEEE transactions on device and materials reliability (01.06.2013)
Published in IEEE transactions on device and materials reliability (01.06.2013)
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Magazine Article