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Year of Publication 18.07.2024
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Year of Publication 10.07.2024
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IMPROVED DETECTORS FOR MICROSCOPY
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MULTI-BEAM SCANNING TRANSMISSION CHARGED PARTICLE MICROSCOPE
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Year of Publication 22.05.2024
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IMPROVED DETECTOR FOR MICROSCOPE
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Year of Publication 02.07.2024
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Year of Publication 02.07.2024
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Multi-electron-beam imaging apparatus with improved performance
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Year of Publication 06.04.2021
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Year of Publication 06.04.2021
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MULTI-BEAM SCANNING TRANSMISSION CHARGED PARTICLE MICROSCOPE
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Year of Publication 09.09.2020
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Year of Publication 09.09.2020
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Year of Publication 19.03.2020
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Year of Publication 19.03.2020
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MULTI-ELECTRON-BEAM IMAGING APPARTUS WITH IMPROVED PERORMANCE
Veen, van Gerard Nicolaas Anne, Mohammadi-Gheidari, Ali, Kieft, Erik René, Tiemeijer, Peter Christiaan
Year of Publication 18.03.2020
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Year of Publication 18.03.2020
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EELS detection technique in an electron microscope
van Veen, Gerard Nicolaas Anne, Kuijper, Maarten, Lazar, Sorin, Kujawa, Stephan, McCormack, Jamie, Freitag, Bert Henning, Tiemeijer, Peter Christiaan
Year of Publication 10.11.2020
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Year of Publication 10.11.2020
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Emission noise correction of a charged particle source
Mele, Luigi, Mohammadi-Gheidari, Ali, van Veen, Gerard Nicolaas Anne, Slingerland, Hendrik Nicolaas, Tiemeijer, Peter Christiaan
Year of Publication 22.10.2019
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Year of Publication 22.10.2019
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EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE
van Veen, Gerard Nicolaas Anne, Kuijper, Maarten, Lazar, Sorin, Kujawa, Stephan, McCormack, Jamie, Freitag, Bert Henning, Tiemeijer, Peter Christiaan
Year of Publication 07.11.2019
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Year of Publication 07.11.2019
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EMISSION NOISE CORRECTION OF A CHARGED PARTICLE SOURCE
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Year of Publication 16.08.2018
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Year of Publication 16.08.2018
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Charged particle microscope with improved spectroscopic functionality
Withaar Thijs Thomas, van Veen Gerard Nicolaas Anne, Kooijman Cornelis Sander
Year of Publication 07.11.2017
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Year of Publication 07.11.2017
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