Experimental and Simulation Analysis of Program/Retention Transients in Silicon Nitride-Based NVM Cells
Vianello, E., Driussi, F., Arreghini, A., Palestri, P., Esseni, D., Selmi, L., Akil, N., van Duuren, M.J., Golubovic, D.S.
Published in IEEE transactions on electron devices (01.09.2009)
Published in IEEE transactions on electron devices (01.09.2009)
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Journal Article
Experimental Characterization of the Vertical Position of the Trapped Charge in Si Nitride-Based Nonvolatile Memory Cells
Arreghini, A., Driussi, F., Vianello, E., Esseni, D., van Duuren, M.J., Golubovic, D.S., Akil, N., van Schaijk, R.
Published in IEEE transactions on electron devices (01.05.2008)
Published in IEEE transactions on electron devices (01.05.2008)
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Journal Article
A Simulation Study of the Punch-Through-Assisted Hot Hole Injection Mechanism for Nonvolatile Memory Cells
Iellina, Matteo, Palestri, Pierpaolo, Akil, Nader, van Duuren, Michiel J, Driussi, Francesco, Esseni, David, Selmi, Luca
Published in IEEE transactions on electron devices (01.05.2010)
Published in IEEE transactions on electron devices (01.05.2010)
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Journal Article
Analysis of nitride storage non-volatile memories with HfSiOx blocking dielectric and TiN metal gate for low power embedded applications
GOLUBOVIE, Ousan S, VAN DUUREN, Michiel J, AKIL, Nader, ARREGHINI, Antonio, DRIUSSI, Francesco
Published in Microelectronic engineering (01.10.2009)
Published in Microelectronic engineering (01.10.2009)
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Journal Article
Explanation of SILC Probability Density Distributions With Nonuniform Generation of Traps in the Tunnel Oxide of Flash Memory Arrays
Vianello, E., Driussi, F., Esseni, D., Selmi, L., Widdershoven, F., van Duuren, M.J.
Published in IEEE transactions on electron devices (01.08.2007)
Published in IEEE transactions on electron devices (01.08.2007)
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Journal Article
Experimental characterization of statistically independent defects in gate dielectrics-part II: experimental results on flash memory arrays
Driussi, F., Widdershoven, F., Esseni, D., Selmi, L., van Duuren, M.J.
Published in IEEE transactions on electron devices (01.05.2005)
Published in IEEE transactions on electron devices (01.05.2005)
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Journal Article
Monitoring Flash EEPROM Reliability by Equivalent Cell Analysis
Ielmini, D., Spinelli, A.S., Lacaita, A.L., Gubello, M., van Duuren, M.
Published in 32nd European Solid-State Device Research Conference (2002)
Published in 32nd European Solid-State Device Research Conference (2002)
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Conference Proceeding
Multichannel SQUID magnetometry using double relaxation oscillation SQUID's
van Duuren, M.J., Lee, Y.H., Adelerhof, D.J., Kawai, J., Kado, H., Flokstra, J., Rogalla, H.
Published in IEEE transactions on applied superconductivity (01.03.1996)
Published in IEEE transactions on applied superconductivity (01.03.1996)
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Journal Article
Analysis of nitride storage non-volatile memories with HfSiO(x) blocking dielectric and TiN metal gate for low power embedded applications
Golubovic, Dusan S, Van Duuren, Michiel J, Akil, Nader, Arreghini, Antonio, Driussi, Francesco
Published in Microelectronic engineering (01.10.2009)
Published in Microelectronic engineering (01.10.2009)
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Journal Article
Analysis of nitride storage non-volatile memories with HfSiO x blocking dielectric and TiN metal gate for low power embedded applications
Golubović, Dušan S., van Duuren, Michiel J., Akil, Nader, Arreghini, Antonio, Driussi, Francesco
Published in Microelectronic engineering (2009)
Published in Microelectronic engineering (2009)
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Journal Article
Impact of Device Layout and Annealing Process During the Passivation of Interface States in Presence of Silicon Nitride Layers : International Conference on Microelectronic Test Structures
DRIUSSI, Francesco, SELMI, Luca, AKIL, Nader, VAN DUUREN, Michiel J, VAN SCHAIJK, Rob
Published in IEEE transactions on semiconductor manufacturing (2008)
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Published in IEEE transactions on semiconductor manufacturing (2008)
Journal Article
Defect generation statistics in thin gate oxides
Ielmini, D., Spinelli, A.S., Lacaita, A.L., van Duuren, M.J.
Published in IEEE transactions on electron devices (01.08.2004)
Published in IEEE transactions on electron devices (01.08.2004)
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Journal Article
Impact of correlated generation of oxide defects on SILC and breakdown distributions
Ielmini, D., Spinelli, A.S., Lacaita, A.L., van Duuren, M.J.
Published in IEEE transactions on electron devices (01.08.2004)
Published in IEEE transactions on electron devices (01.08.2004)
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Journal Article