Monte Carlo analysis of high-frequency non-equilibrium transport in mercury-cadmium-telluride for infrared detection
Palermo, Christophe, Varani, Luca, Vaissière, Jean-Claude
Published in Semiconductor science and technology (01.04.2004)
Published in Semiconductor science and technology (01.04.2004)
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Conference Proceeding
Simulation of current fluctuations in submicron n-MOSFETs operating in the hot-carrier regime at RF frequencies using two-dimensional impedance field method
Contaret, Thierry, Varani, Luca, Vaissière, Jean-Claude
Published in Semiconductor science and technology (01.04.2004)
Published in Semiconductor science and technology (01.04.2004)
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ADMITTANCE FIELD METHOD FOR THE CALCULATION OF THE SPECTRAL DENSITY OF CURRENT FLUCTUATIONS
SHIKTOROV, PAVEL, STARIKOV, EVGENIJ, GRUŽINSKIS, VIKTORAS, VARANI, LUCA, VAISSIERE, JEAN-CLAUDE, NOUGIER, JEAN-PIERRE, REGGIANI, LINO
Published in Fluctuation and noise letters (01.03.2001)
Published in Fluctuation and noise letters (01.03.2001)
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UPCONVERSION OF INTERGROUP HOT-CARRIER NOISE IN SEMICONDUCTORS OPERATING UNDER PERIODIC LARGE-SIGNAL CONDITIONS
SHIKTOROV, PAVEL, STARIKOV, EVGENIJ, GRUŽINSKIS, VIKTORAS, PEREZ, SUSANA, GONZALEZ, TOMAS, REGGIANI, LINO, VARANI, LUCA, VAISSIERE, JEAN-CLAUDE
Published in Fluctuation and noise letters (01.03.2003)
Published in Fluctuation and noise letters (01.03.2003)
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Hot-carrier fluctuations from ballistic to diffusive regime in submicron semiconductor structures
Varani, L, Reggiani, L, Houlet, P, Vaissiere, J C, Nougier, J P, Kuhn, T, Gonzalez, T, Pardo, D
Published in Semiconductor science and technology (01.05.1994)
Published in Semiconductor science and technology (01.05.1994)
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A Monte Carlo simulator including generation recombination processes
Reggiani, Lino, Kuhn, Tilmann, Varani, Luca, Gasquet, Daniel, Vaissiere, Jean Claude, Nougier, Jean Pierre
Published in ESSDERC '90: 20th European Solid State Device Research Conference (01.09.1990)
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Published in ESSDERC '90: 20th European Solid State Device Research Conference (01.09.1990)
Conference Proceeding
Field-dependent electronic noise of lightly doped p-type Si at 77 K
Kuhn, T, Reggiani, L, Varani, L, Gasquet, D, Vaissière, JC, Nougier, JP
Published in Physical review. B, Condensed matter (15.07.1991)
Published in Physical review. B, Condensed matter (15.07.1991)
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