Rozhl'ady/Správy/Glosy
Slavkovský, Peter, Mušinka, Mikuláš, Válka, Miroslav, Krekovičová, Eva, Varchol, Jozef, Botíková, Marta, Nádaská, Katarína, Salner, Peter, Kiliánová, Gabriela, Krišková, Zdena, Michvocíková, Veronika, Kušnierová, Daniela, Voľanská, Ľubica, Padušňáková, Martina, Hlinčíková, Miroslava
Published in Slovenský národopis (2016)
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Published in Slovenský národopis (2016)
Journal Article
Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector
Dilillo, L., Bosio, A., Valka, M., Girard, P., Pravossoudovitch, S., Virazel, A.
Published in 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (01.10.2011)
Published in 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (01.10.2011)
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Conference Proceeding
Peak Power Estimation: A Case Study on CPU Cores
Bernardi, P., De Carvalho, M., Sanchez, E., Reorda, M. S., Bosio, A., Dilillo, L., Girard, P., Valka, M.
Published in 2012 IEEE 21st Asian Test Symposium (01.11.2012)
Published in 2012 IEEE 21st Asian Test Symposium (01.11.2012)
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Conference Proceeding
Power Supply Noise Sensor Based on Timing Uncertainty Measurements
Valka, M., Bosio, A., Dilillo, L., Girard, P., Todri, A., Virazel, A., Debaud, P., Guilhot, S.
Published in 2012 IEEE 21st Asian Test Symposium (01.11.2012)
Published in 2012 IEEE 21st Asian Test Symposium (01.11.2012)
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Conference Proceeding
High frequency jitter estimator for SoCs
Le Gall, Herve, Alhakim, Rshdee, Valka, Miroslav, Mir, Salvador, Stratigopoulos, Haralampos-G, Simeu, Emmanuel
Published in 2015 20th IEEE European Test Symposium (ETS) (01.05.2015)
Published in 2015 20th IEEE European Test Symposium (ETS) (01.05.2015)
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Conference Proceeding