by Zábranský, Lukáš, Bernátová, Katarína, Dluhoš, Jiří, Váňa, Rostislav, Souček, Pavel, Vašina, Petr, Buršíková, Vilma
Published in Materials (08.07.2020)

by Kuzníková, L'ubomíra, Dědková, Kateřina, Pavelek, Lubomír, Kupková, Jana, Váňa, Rostislav, Kukutschová, Jana
Published in Journal of nanoscience and nanotechnology (01.05.2019)

by Kalasová, Dominika, Dvořák, Karel, Slobodník, Marek, Všianský, Dalibor, Zikmund, Tomáš, Dluhoš, Jiří, Váňa, Rostislav, Bureš, Jaroslav, Kaiser, Jozef
Published in Construction & building materials (20.06.2018)

by Quigley, Lisa, O'Sullivan, Daniel J, Daly, David, O'Sullivan, Orla, Burdikova, Zuzana, Vana, Rostislav, Beresford, Tom P, Ross, R Paul, Fitzgerald, Gerald F, McSweeney, Paul L H, Giblin, Linda, Sheehan, Jeremiah J, Cotter, Paul D
Published in mSystems (01.05.2016)

by Dědková, Kateřina, Janíková, Barbora, Matějová, Kateřina, Čabanová, Kristina, Váňa, Rostislav, Kalup, Aleš, Hundáková, Marianna, Kukutschová, Jana
Published in Journal of photochemistry and photobiology. B, Biology (01.10.2015)

by Záchej, Samuel, Havránková, Jana, Rosíková, Kristýna, Váńa, Rostislav, Havelka, Miloslav
Published in Microscopy and microanalysis (01.08.2018)

by Tucek, Marek, Blando, Rodrigo, Vana, Rostislav, Hladik, Lukas, Obona, Jozef Vincenc
Published in 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (20.07.2020)

by Záchej, Samuel, Pinkas, Dominik, Zánová, Martina, Filimonenko, Vlada, Javůrek, Jakub, Váňa, Rostislav
Published in Microscopy and microanalysis (22.07.2023)

by Šikula, Marek, Hladík, Lukáš, Oboňa, Jozef, Váňa, Rostislav
Published in Microscopy and microanalysis (01.08.2020)

by Váňa, Rostislav, Rosíková, Kristýna, Javůrek, Jakub, Nováček, Tomáš, Havránková, Jana, Záchej, Samuel
Published in Microscopy and microanalysis (01.08.2019)

by Záchej, Samuel, Heuser, Thomas, Hovádková, Zuzana, Havránková, Jana, Rosíková, Kristýna, Váňa, Rostislav
Published in Microscopy and microanalysis (01.08.2019)

by Vana, Rostislav, Dluhos, Jifi, Varga, Marian, Schmid, Christoph, Kromka, Alexander
Published in Microscopy and microanalysis (01.07.2017)

by Váňa, Rostislav, Dluhoš, Jiří, Hladík, Lukáš, Lindsay, John, Goulden, Jenny
Published in Microscopy and microanalysis (01.07.2017)

by Kalasova, Dominika, Dvorak, Karel, Slobodnik, Marek, Vsiansky, Dalibor, Zikmund, Tomas, Dluhos, Jiri, Vana, Rostislav, Bures, Jaroslav, Kaiser, Jozef
Published in Construction & building materials (20.06.2018)

by Havelka, Miloslav, Jiruse, Jaroslav, Hrncif, Tomas, Jan Polster, Vana, Rostislav, Zachej, Samuel
Published in Microscopy and microanalysis (01.08.2018)

by Wille, Guillaume, Lahondere, Didier, Schmidt, Ute, Duron, Jeromine, Vana, Rostislav, Silvent, Jeremie, Bourrat, Xavier
Published in Microscopy and microanalysis (01.08.2018)

by Lisa Quigley, Daniel J. O’Sullivan, David Daly, Orla O’Sullivan, Zuzana Burdikova, Rostislav Vana, Tom P. Beresford, R. Paul Ross, Gerald F. Fitzgerald, Paul L. H. McSweeney, Linda Giblin, Jeremiah J. Sheehan, Paul D. Cotter
Published in mSystems (01.06.2016)

by Sharang, S, Dluhos, Jiri, Kalasova, Dominika, Denisyuk, Andrey, Vana, Rostislav, Zikmund, Tomas, Kaiser, Jozef, Obona, Jozef Vincenc
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)