Search Results - "Uznanski, Slawosz" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

LHC and HL-LHC: Present and Future Radiation Environment in the High-Luminosity Collision Points and RHA Implications

LHC and HL-LHC: Present and Future Radiation Environment in the High-Luminosity Collision Points and RHA Implications

by Garcia Alia, Ruben, Brugger, Markus, Cerutti, Francesco, Danzeca, Salvatore, Ferrari, Alfredo, Gilardoni, Simone, Kadi, Yacine, Kastriotou, Maria, Lechner, Anton, Martinella, Corinna, Stein, Oliver, Thurel, Yves, Tsinganis, Andrea, Uznanski, Slawosz
Published in IEEE transactions on nuclear science (01.01.2018)

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Journal Article

System-Level Total Ionizing Dose Testing of Satellite Subsystems: EagleEye Microsatellite Case Study

System-Level Total Ionizing Dose Testing of Satellite Subsystems: EagleEye Microsatellite Case Study

by Rajkowski, Tomasz, Pustułka, Przemysław, Bieda, Marcin, Ślasa, Sylwia, Kazaniecki, Michał, Myszka, Kamil, Szczygielski, Mateusz, Iwaszkiewicz, Jarosław, Traczyk, Konrad, Tarenko, Kamil, Hołownia, Adam, Ładno, Michał, Bińczyk, Piotr, Wasilewski, Szymon, Mazur, Marcin, Zawistowski, Tomasz, Uznański, Sławosz, Kosiński, Tymoteusz, Chabera, Mariusz, Mazurek, Krzysztof, Klimaszewski, Jan, Wasilewski, Adam, Matusiak, Michał, Wronka, Sławomir
Published in Electronics (Basel) (01.01.2024)

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Journal Article

Monte-Carlo Based Charge Sharing Investigations on a Bulk 65 nm RHBD Flip-Flop

Monte-Carlo Based Charge Sharing Investigations on a Bulk 65 nm RHBD Flip-Flop

by Uznanski, S, Gasiot, G, Roche, P, Autran, J, Ferlet-Cavrois, V
Published in IEEE transactions on nuclear science (01.12.2010)

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Journal Article

Radiation Environment in the Large Hadron Collider During the 2022 Restart and Related RHA Implications

Radiation Environment in the Large Hadron Collider During the 2022 Restart and Related RHA Implications

by Bilko, Kacper, Alia, Ruben Garcia, Aguiar, Ygor, Danzeca, Salvatore, Francesca, Diego Di, Gilardoni, Simone, Girard, Sylvain, Ricci, Daniel, Sebban, Marc, Uznanski, Slawosz
Published in IEEE transactions on nuclear science (01.04.2024)

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Journal Article

Single event effects in high-energy accelerators

Single event effects in high-energy accelerators

by Alía, Rubén García, Brugger, Markus, Danzeca, Salvatore, Cerutti, Francesco, Saraiva, Joao Pedro de Carvalho, Denz, Reiner, Ferrari, Alfredo, Foro, Lionel L, Peronnard, Paul, Røed, Ketil, Secondo, Raffaello, Steckert, Jens, Thurel, Yves, Toccafondo, Iacocpo, Uznanski, Slawosz
Published in Semiconductor science and technology (01.03.2017)

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Journal Article

Radiation Hardness Assurance Methodology of Radiation Tolerant Power Converter Controls for Large Hadron Collider

Radiation Hardness Assurance Methodology of Radiation Tolerant Power Converter Controls for Large Hadron Collider

by Uznanski, Slawosz, Todd, Benjamin, Dinius, Arend, King, Quentin, Brugger, Markus
Published in IEEE transactions on nuclear science (01.12.2014)

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Journal Article

The Effect of Proton Energy on SEU Cross Section of a 16 Mbit TFT PMOS SRAM with DRAM Capacitors

The Effect of Proton Energy on SEU Cross Section of a 16 Mbit TFT PMOS SRAM with DRAM Capacitors

by Uznanski, Slawosz, Alia, Ruben Garcia, Blackmore, Ewart, Brugger, Markus, Gaillard, Remi, Mekki, Julien, Todd, Benjamin, Trinczek, Michael, Villanueva, Andrea Vilar
Published in IEEE transactions on nuclear science (01.12.2014)

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Journal Article

SEL Hardness Assurance in a Mixed Radiation Field

SEL Hardness Assurance in a Mixed Radiation Field

by Alia, Ruben Garcia, Brugger, Markus, Danzeca, Salvatore, Ferlet-Cavrois, Veronique, Frost, Christopher, Gaillard, Remi, Mekki, Julien, Saigne, Frederic, Thornton, Adam, Uznanski, Slawosz, Wrobel, Frederic
Published in IEEE transactions on nuclear science (01.12.2015)

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Journal Article

SEE Testing in the 24-GeV Proton Beam at the CHARM Facility

SEE Testing in the 24-GeV Proton Beam at the CHARM Facility

by Garcia Alia, Ruben, Brugger, Markus, Cecchetto, Matteo, Cerutti, Francesco, Danzeca, Salvatore, Delrieux, Marc, Kastriotou, Maria, Tali, Maris, Uznanski, Slawosz
Published in IEEE transactions on nuclear science (01.08.2018)

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Journal Article

Single Event Upset and Multiple Cell Upset Modeling in Commercial Bulk 65-nm CMOS SRAMs and Flip-Flops

Single Event Upset and Multiple Cell Upset Modeling in Commercial Bulk 65-nm CMOS SRAMs and Flip-Flops

by Uznanski, S, Gasiot, G, Roche, P, Tavernier, C, Autran, Jean-Luc
Published in IEEE transactions on nuclear science (01.08.2010)

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Journal Article

Underground Experiment and Modeling of Alpha Emitters Induced Soft-Error Rate in CMOS 65 nm SRAM

Underground Experiment and Modeling of Alpha Emitters Induced Soft-Error Rate in CMOS 65 nm SRAM

by Martinie, Sebastien, Autran, Jean-Luc, Sauze, Sebastien, Munteanu, Daniela, Uznanski, Slawosz, Roche, Philippe, Gasiot, Gilles
Published in IEEE transactions on nuclear science (01.08.2012)

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Journal Article

Proton Dominance of Sub-LET Threshold GCR SEE Rate

Proton Dominance of Sub-LET Threshold GCR SEE Rate

by Alia, Ruben Garcia, Brugger, Markus, Ferlet-Cavrois, Veronique, Brandenburg, Sytze, Calcutt, Jordan, Cerutti, Francesco, Daly, Eamonn, Ferrari, Alfredo, Muschitiello, Michele, Santin, Giovanni, Uznanski, Slawosz, Van Goethem, Marc-Jan, Zadeh, Ali
Published in IEEE transactions on nuclear science (01.01.2017)

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Journal Article

Energy Dependence of Tungsten-Dominated SEL Cross Sections

Energy Dependence of Tungsten-Dominated SEL Cross Sections

by Alia, Ruben Garcia, Brugger, Markus, Danzeca, Salvatore, Ferlet-Cavrois, Veronique, Poivey, Christian, Roed, Ketil, Saigne, Fraedaeric, Spiezia, Giovanni, Uznanski, Slawosz, Saigne, Frederic
Published in IEEE transactions on nuclear science (01.10.2014)

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Journal Article

SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate

SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate

by Alia, Ruben Garcia, Blackmore, Ewart W., Brugger, Markus, Danzeca, Salvatore, Ferlet-Cavrois, Veronique, Gaillard, Remi, Mekki, Julien, Poivey, Christian, Roed, Ketil, Saigne, Frederic, Spiezia, Giovanni, Trinczek, Michael, Uznanski, Slawosz, Wrobel, Frederic
Published in IEEE transactions on nuclear science (01.12.2014)

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Journal Article

SEE Measurements and Simulations Using Mono-Energetic GeV-Energy Hadron Beams

SEE Measurements and Simulations Using Mono-Energetic GeV-Energy Hadron Beams

by Alia, Ruben G., Brugger, Markus, Danzeca, Salvatore, Ferlet-Cavrois, Veronique, Poivey, Christian, Roed, Ketil, Saigne, Frederic, Spiezia, Giovanni, Uznanski, Slawosz, Wrobel, Frederic
Published in IEEE transactions on nuclear science (01.12.2013)

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Journal Article

Combining GEANT4 and TIARA for Neutron Soft Error-Rate Prediction of 65 nm Flip-Flops

Combining GEANT4 and TIARA for Neutron Soft Error-Rate Prediction of 65 nm Flip-Flops

by Uznanski, S., Gasiot, G., Roche, P., Semikh, S., Autran, J-L
Published in IEEE transactions on nuclear science (01.12.2011)

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Journal Article

Radiation Hardness Assurance Methodology of radiation tolerant power converter controls for Large Hadron Collider

Radiation Hardness Assurance Methodology of radiation tolerant power converter controls for Large Hadron Collider

by Uznanski, Slawosz, Todd, Benjamin, Dinius, Arend, King, Quentin, Brugger, Markus
Published in 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) (01.10.2013)

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Conference Proceeding

Heavy Ion Characterization and Monte Carlo Simulation on 32 nm CMOS Bulk Technology

Heavy Ion Characterization and Monte Carlo Simulation on 32 nm CMOS Bulk Technology

by Uznanski, S., Gasiot, G., Roche, P., Autran, J., Dugoujon, L.
Published in IEEE transactions on nuclear science (01.12.2011)

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Journal Article

SEE and TID Test Results of Candidate Electronics for LHC Power Converter Control

SEE and TID Test Results of Candidate Electronics for LHC Power Converter Control

by Uznanski, Slawosz, Todd, Benjamin, Dinius, Arend, King, Quentin, Motala, Karol, Brugger, Markus, Spiezia, Giovanni, Gousiou, Evangelia
Published in 2013 IEEE Radiation Effects Data Workshop (REDW) (01.07.2013)

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Conference Proceeding

Experimental characterization of process corners effect on SRAM alpha and neutron Soft Error Rates

Experimental characterization of process corners effect on SRAM alpha and neutron Soft Error Rates

by Gasiot, G., Glorieux, M., Uznanski, S., Clerc, S., Roche, P.
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)

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Conference Proceeding