X-ray Photon Counting and Two-Color X-ray Imaging Using Indirect Detection
Dierickx, Bart, Yao, Qiang, Witvrouwen, Nick, Uwaerts, Dirk, Vandewiele, Stijn, Gao, Peng
Published in Sensors (Basel, Switzerland) (26.05.2016)
Published in Sensors (Basel, Switzerland) (26.05.2016)
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Total dose and displacement damage effects in a radiation-hardened CMOS APS
Bogaerts, J., Dierickx, B., Meynants, G., Uwaerts, D.
Published in IEEE transactions on electron devices (01.01.2003)
Published in IEEE transactions on electron devices (01.01.2003)
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A logarithmic response CMOS image sensor with on-chip calibration
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Published in IEEE journal of solid-state circuits (01.08.2000)
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