by Trentzsch, M., Flachowsky, S., Richter, R., Paul, J., Reimer, B., Utess, D., Jansen, S., Mulaosmanovic, H., Muller, S., Slesazeck, S., Ocker, J., Noack, M., Muller, J., Polakowski, P., Schreiter, J., Beyer, S., Mikolajick, T., Rice, B.
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)

by Stegmann, H, Ritz, Y, Utess, D, Engelmann, H-J, Zschech, E
Published in Microscopy and microanalysis (01.07.2009)

by Triyoso, Dina H., Hempel, K., Ohsiek, S., Jaschke, V., Shu, J., Mutas, S., Dittmar, K., Schaeffer, J., Utess, D., Lenski, M.
Published in ECS journal of solid state science and technology (01.01.2013)

by Wojcik, H., Junige, M., Bartha, W., Albert, M., Neumann, V., Merkel, U., Peeva, A., Gluch, J., Menzel, S., Munnik, F., Liske, R., Utess, D., Richter, I., Klein, C., Engelmann, H. J., Ho, P., Hossbach, C., Wenzel, C.
Published in Journal of the Electrochemical Society (01.01.2012)

by Aydin, Ömür Işıl, Holt, Judson Robert, Le Royer, Cyrille, Vanamurthy, Laks, Feudel, Thomas, Heyne, Tobias, Gerber, Ralf, Lenski, Markus, Jansen, Sören, Utess, Dirk, Klein, Christoph, Peeva, Anita, Mulfinger, George Robert, McArdle, Timothy J, Barge, David, Divay, Alexis, Lehmann, Steffen, Smith, Elliot, Peters, Carsten, Sachse, Jens-Uwe
Published in ECS transactions (20.07.2018)

by Triyoso, D. H., Weinreich, W., Seidell, K., Nolan, M. G., Polakowski, P., Utess, D., Ohsiek, S., Dittmar, K., Weisheit, M., Licbau, M., Fox, R.
Published in 2014 IEEE International Conference on IC Design & Technology (01.05.2014)

by Sessi, V., Simon, M., Slesazeck, S., Drescher, M., Mulaosmanovic, H., Li, K., Binder, R., Waidmann, S., Zeun, A., Pawlik, A.-S., Utess, D., Gottleuber, V., Muller, S., Feldner, K., Heinzig, A., Dunkel, S., Kolodinski, S., Mikolajick, T., Trommer, J., Wiatr, M.
Published in 2021 Silicon Nanoelectronics Workshop (SNW) (13.06.2021)

by Schippel, C., Lehmann, S., Ong, S.N., Muehlhoff, A., Cortes, I., Chow, W.H., Utess, D., Zaka, A., Divay, A., Pakfar, A., Faul, J., Mazurier, J., Chew, K.W., Chan, L.H.K., Taylor, R., Rice, B., Harame, D.
Published in 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (01.10.2018)

by Utess, D., Wuerfel, A., Langer, E., Engelmann, H. J., Lehmann, R.
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)

by APPELFELLER,KLAUS,DD, WESCHENFELDER,DIETMAR,DD, UTESS,SABINE,DD
Year of Publication 20.09.1989

by WESCHENFELDER,DIETMAR,DD, UTESS,SABINE,DD, APELLFELLER,KLAUS,DD
Year of Publication 06.09.1989

by WESCHENFELDER,DIETMAR,DE, APPELFELLER,KLAUS,DE, UTESS,SABINE,DE, LUNOW,ANDRE,DE
Year of Publication 14.02.1991

by EPPERLEIN,JOACHIM,DD, MARKS,GUENTER,DD, MARX,JOERG,DD, UTESS,BENNO,DD
Year of Publication 16.05.1984

by STARK,ANDREAS,DE, UTESS,SABINE,DE, OSCHMANN,BERND,DE, KAESTNER,RAINER,DE, ZIELKE,MICHAELA,DE
Year of Publication 13.06.1991

by STARK,ANDREAS,DE, ASCHENBACH,KARSTEN,DD, UTESS,SABINE,DE, OSCHMANN,BERND,DE, KAESTNER,RAINER,DE, ZIELKE,MICHAELA,DE
Year of Publication 13.06.1991

by UTESS,KLAUS-DIETER,DD, MOBIUS,HANS-HEINRICH,DD, GUTH,ULRICH,DD, JAKOBS,STEFFEN,DD, HARTUNG,REINHOLD,DD
Year of Publication 18.09.1986

by HADINEK,LUTZ,DD, AHRENS,WOLFGANG,DD, MASCHECK,ANDREAS,DD, MUELLER,BERND,DD, BLOCK,FRANK,DD, UNGER,ANNEGRET,DD, GROSSOEHME,GUNHILD,DD, UTESS,BAERBEL,DD
Year of Publication 30.10.1985

by UTESS,KLAUS-DIETER,DD, GUTH,ULRICH,DD, JAKOBS,STEFFEN,DD, MOEBIUS,HANS-HEINRICH,DD, HARTUNG,REINHOLD,DD
Year of Publication 17.10.1979

by KAUBISCH,ECKARD,DD, UTESS,KLAUS-DIETER,DD, SCHOLZ,PETER,DD, KAROS,BRUNO,DD, GROSSMANN,EVA,DD, STUEHMER,KARL-HEINZ,DD, STRUEWING,HEIDRUN,DD, VOGEL,GUENTHER,DD
Year of Publication 27.02.1985