Spectral photoluminescence measurements for in-line absorber characterization in thin-film production lines
Uredat, S., Lange, T., Schenk, T.
Published in 2011 37th IEEE Photovoltaic Specialists Conference (01.06.2011)
Published in 2011 37th IEEE Photovoltaic Specialists Conference (01.06.2011)
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Conference Proceeding
METHOD FOR CALIBRATING A PYROMETER, METHOD FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTING WAFER AND SYSTEM FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTING WAFER
SCHENK TOBIAS, ZETTLER JOERG THOMAS, HENNINGER BERND, UREDAT STEFFEN, BINETTI MARCELLO, ZILIAN JENS, HABERLAND KOLJA
Year of Publication 22.11.2010
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Year of Publication 22.11.2010
Patent