Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards
Senoner, M., Maaßdorf, A., Rooch, H., Österle, W., Malcher, M., Schmidt, M., Kollmer, F., Paul, D., Hodoroaba, V.-D., Rades, S., Unger, W. E. S.
Published in Analytical and bioanalytical chemistry (01.04.2015)
Published in Analytical and bioanalytical chemistry (01.04.2015)
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Journal Article
Erratum to: Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards
Senoner, M., Maaßdorf, A., Rooch, H., Österle, W., Malcher, M., Schmidt, M., Kollmer, F., Paul, D., Hodoroaba, V.-D., Rades, S., Unger, W. E. S.
Published in Analytical and bioanalytical chemistry (01.04.2015)
Published in Analytical and bioanalytical chemistry (01.04.2015)
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Journal Article
Quantification of Silane Molecules on Oxidized Silicon: Are there Options for a Traceable and Absolute Determination?
Dietrich, P. M., Streeck, C., Glamsch, S., Ehlert, C., Lippitz, A., Nutsch, A., Kulak, N., Beckhoff, B., Unger, W. E. S.
Published in Analytical chemistry (Washington) (06.10.2015)
Published in Analytical chemistry (Washington) (06.10.2015)
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Journal Article
Ultra-thin SiO2 on Si IX: absolute measurements of the amount of silicon oxide as a thickness of SiO2 on Si
Seah, M. P., Unger, W. E. S., Wang, Hai, Jordaan, W., Gross, Th, Dura, J. A., Moon, Dae Won, Totarong, P., Krumrey, M., Hauert, R., Zhiqiang, Mo
Published in Surface and interface analysis (01.05.2009)
Published in Surface and interface analysis (01.05.2009)
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Real Time Imaging of Deuterium in a Duplex Stainless Steel Microstructure by Time-of-Flight SIMS
Sobol, O., Straub, F., Wirth, Th, Holzlechner, G., Boellinghaus, Th, Unger, W. E. S.
Published in Scientific reports (02.02.2016)
Published in Scientific reports (02.02.2016)
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Thickness measurement of nm HfO2 films
Kim, K J, Kim, A, Kim, C S, Song, S W, Ruh, H, Unger, W E S, Radnik, J, Mata-Salazar, J, Juarez-Garcia, J M, Cortazar-Martinez, O, Herrera-Gomez, A, Hansen, P E, Madesen, J S, Senna, C A, Archanjo, B S, Damasceno, J C, Achete, C A, Wang, H, Wang, M, Windover, D, Steel, E, Kurokawa, A, Fujimoto, T, Azuma, Y, Terauchi, S, Zhang, L, Jordaan, W A, Spencer, S J, Shard, A G, Koenders, L, Krumrey, M, Busch, I, Jeynes, C
Published in Metrologia (01.01.2021)
Published in Metrologia (01.01.2021)
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Dual beam organic depth profiling using large argon cluster ion beams
Holzweber, M., Shard, A. G., Jungnickel, H., Luch, A., Unger, W. E. S.
Published in Surface and interface analysis (01.10.2014)
Published in Surface and interface analysis (01.10.2014)
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Journal Article
Derivatization of amino groups by pentafluorobenzaldehyde (PFB) as observed by XPS and NEXAFS spectroscopy on spin coated 4,4′-methylenebis(2,6-diethylaniline) films
Yegen, E., Lippitz, A., Treu, D., Unger, W. E. S.
Published in Surface and interface analysis (01.03.2008)
Published in Surface and interface analysis (01.03.2008)
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Journal Article
Conference Proceeding
Lateral Resolution of Imaging Surface-Analytical Instruments as SIMS, AES and XPS: Application of the BAM-L200 Certified Reference Material and Related ISO Standards
Unger, W. E. S., Senoner, M., Wirth, Th, Bütefisch, S., Busch, I.
Published in Journal of Surface Analysis (2017)
Published in Journal of Surface Analysis (2017)
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Journal Article
Radio frequency (r.f.) plasma-deposited polymer films: influence of external plasma parameters as viewed by comprehensive in-situ surface chemical analysis by XAS, XPS and ToF-SIMS
Unger, W. E. S., Swaraj, S., Oran, U., Lippitz, A.
Published in Surface and interface analysis (01.04.2006)
Published in Surface and interface analysis (01.04.2006)
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Journal Article
Conference Proceeding
Static ToF-SIMS analysis of plasma chemically deposited ethylene/allyl alcohol co-polymer films
Oran, U., Swaraj, S., Friedrich, J.F., Unger, W.E.S.
Published in Applied surface science (30.07.2006)
Published in Applied surface science (30.07.2006)
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Conference Proceeding
Simultaneous surface and bulk sensitive XAS measurements of magnetic particle clusters
Swaraj, S, Dietrich, P M, Unger, W E S
Published in Journal of physics. Conference series (01.06.2017)
Published in Journal of physics. Conference series (01.06.2017)
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Journal Article
Cyclodextrin - ferrocene host - guest complexes on silicon oxide surfaces
Nietzold, C., Dietrich, P. M., Lippitz, A., Panne, U., Unger, W. E. S.
Published in Surface and interface analysis (01.07.2016)
Published in Surface and interface analysis (01.07.2016)
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Journal Article
Stress corrosion cracking of gas-tungsten arc welds in continuous-cast AZ31 Mg alloy sheet
Winzer, N., Xu, P., Bender, S., Gross, T., Unger, W.E.S., Cross, C.E.
Published in Corrosion science (01.09.2009)
Published in Corrosion science (01.09.2009)
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Journal Article
Inter-laboratory comparison: Quantitative surface analysis of thin Fe-Ni alloy films
Kim, K. J., Unger, W. E. S., Kim, J. W., Moon, D. W., Gross, T., Hodoroaba, V.-D., Schmidt, D., Wirth, T., Jordaan, W., van Staden, M., Prins, S., Zhang, L., Fujimoto, T., Song, X. P., Wang, H.
Published in Surface and interface analysis (01.02.2012)
Published in Surface and interface analysis (01.02.2012)
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