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Electron mobility in ULSI MOSFETs: effect of interface traps and oxide nitridation
Perron, L., Lacaita, A.L., Pacelli, A., Bez, R.
Published in IEEE electron device letters (01.05.1997)
Published in IEEE electron device letters (01.05.1997)
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Journal Article
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A novel logic compatible gain cell with two transistors and one capacitor
Ikeda, N., Terano, T., Moriya, H., Emori, T., Kobayashi, T.
Published in 2000 Symposium on VLSI Technology (2000)
Published in 2000 Symposium on VLSI Technology (2000)
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Conference Proceeding
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Very short TAT ULSI trial manufacturing line construction
Kato, S., Suzuki, T., Yamazaki, K., Nakamura, M.
Published in IEEE International Symposium on Semiconductor Manufacturing, 1997 (1997)
Published in IEEE International Symposium on Semiconductor Manufacturing, 1997 (1997)
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Conference Proceeding
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