Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part I: Experimental
Ullmann, Bianka, Jech, Markus, Puschkarsky, Katja, Rott, Gunnar Andreas, Waltl, Michael, Illarionov, Yury, Reisinger, Hans, Grasser, Tibor
Published in IEEE transactions on electron devices (01.01.2019)
Published in IEEE transactions on electron devices (01.01.2019)
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Journal Article
Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part II: Theory
Jech, Markus, Ullmann, Bianka, Rzepa, Gerhard, Tyaginov, Stanislav, Grill, Alexander, Waltl, Michael, Jabs, Dominic, Jungemann, Christoph, Grasser, Tibor
Published in IEEE transactions on electron devices (01.01.2019)
Published in IEEE transactions on electron devices (01.01.2019)
Get full text
Journal Article