Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice
Bennett, S.E., Ulfig, R.M., Clifton, P.H., Kappers, M.J., Barnard, J.S., Humphreys, C.J., Oliver, R.A.
Published in Ultramicroscopy (01.02.2011)
Published in Ultramicroscopy (01.02.2011)
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Journal Article
A High Multiple Hits Correction Factor for Atom Probe Tomography
Larson, D.J., Prosa, T.J., Oltman, E., Reinhard, D.A., Geiser, B.P., Ulfig, R.M., Merkulov, A.
Published in Microscopy and microanalysis (01.08.2018)
Published in Microscopy and microanalysis (01.08.2018)
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Journal Article
Atom Probe Tomography Productivity Enhancements
Reinhard, D.A., Payne, T.R., Strennen, E.M., Oltman, E., Geiser, B.P., Sobering, G.S., Lenz, D.R., Mandt, J., Groth, G.A., Larson, D.J., Ulfig, R.M., Prosa, T.J.
Published in Microscopy and microanalysis (01.08.2019)
Published in Microscopy and microanalysis (01.08.2019)
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Journal Article
Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR
Ulfig, R.M., Prosa, T.J., Lenz, D.R, Payne, T.R.
Published in Microscopy and microanalysis (01.08.2015)
Published in Microscopy and microanalysis (01.08.2015)
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Journal Article
Measurement of Detection Efficiency in Atom Probe Tomography
Prosa, T.J., Geiser, B.P., Ulfig, R.M., Kelly, T.F., Larson, D.J.
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Journal Article
Multi-Region Data Simulation for Detection Limit Investigations in IVAS
Ulfig, R.M., Geiser, B.P., Prosa, T.J., Larson, D.J., Leroux, J., Dupont, B.
Published in Microscopy and microanalysis (01.08.2013)
Published in Microscopy and microanalysis (01.08.2013)
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Journal Article
Using Spatial Distribution Maps to Estimate APT Efficiency
Geiser, B.P., Larson, D.J., Prosa, T.J., Kelly, T.F., Ulfig, R.M.
Published in Microscopy and microanalysis (01.08.2013)
Published in Microscopy and microanalysis (01.08.2013)
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Journal Article
Performance Advances in LEAP systems
Ulfig, R.M., Larson, D.J., Kelly, T.F., Clifton, P.H., Prosa, T.J., Lenz, D.R, Oltman, E.X.
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Journal Article
Atom Probe Tomography Analysis of Grain Boundaries in CdTe
Larson, D.J., Reinhard, D.A., Prosa, T.J., Olson, D., Lawrence, D., Clifton, P.H., Ulfig, R.M., Kelly, T.F., Smentkowski, V.S.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article
Improving Data Quality in Atom Probe Tomography
Larson, D.J., Prosa, T.J., Lawrence, D., Strennen, S.N., Oltman, E., Martin, I., Reinhard, D.A., Giddings, A. D., Olson, D., Bunton, J.H., Ulfig, R.M, Kelly, T.F., Goodwin, J. R., Martens, R.L.
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Journal Article
Laser-Specimen Interactions in Atom Probe Tomography
Kelly, T.F., Bunton, J.H., Prosa, T.J., Ulfig, R.M., Clifton, P.H., Larson, D.J.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article
New Applications in Atom Probe Tomography
Larson, D.J., Valley, J.W., Ushikubo, T., Miller, M.K., Takamizawa, H., Shimizu, Y., Gordon, L.M., Joester, D., Giddings, D., Reinhard, D.A., Prosa, T.J., Olson, D.P., Lawrence, D.F., Clifton, P.H., Ulfig, R.M., Martin, I., Kelly, T.F.
Published in Microscopy and microanalysis (01.08.2013)
Published in Microscopy and microanalysis (01.08.2013)
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Journal Article
New Applications in Atom Probe Tomography
Larson, D.J., Reinhard, D.A., Prosa, T.J., Olson, D., Lawrence, D., Clifton, P.H., Ulfig, R.M., Martin, I., Kelly, T.F., Smentkowski, V.S., Gordon, L.M., Joester, D., Inoue, K.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article
Field ion specimen preparation from near-surface regions
Larson, D.J, Miller, M.K, Ulfig, R.M, Matyi, R.J, Camus, P.P, Kelly, T.F
Published in Ultramicroscopy (01.06.1998)
Published in Ultramicroscopy (01.06.1998)
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Journal Article
Conference Proceeding
DIrect observation of a current-confined-path nano-oxide layer structure by three-dimensional atom probe
Fukuzawa, H., Iwasaki, H., Tanaka, Y., Ulfig, R.M., Larson, D.J.
Published in INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005 (2005)
Published in INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005 (2005)
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Conference Proceeding
Advances in Specimen Preparation for Atom Probe Tomography
Larson, D.J., Thompson, K., Lawrence, D., Kostrna, S.L.P., Prosa, T.J., Ulfig, R.M., Kelly, T.F.
Published in 2006 19th International Vacuum Nanoelectronics Conference (01.07.2006)
Published in 2006 19th International Vacuum Nanoelectronics Conference (01.07.2006)
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Conference Proceeding
Analyzing Si-based structures in 3D with a laser-pulsed local electrode atom probe
Thompson, K, Larson, D J, Ulfig, R M, Bunton, J H, Kelly, T F
Published in Solid state technology (01.06.2006)
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Published in Solid state technology (01.06.2006)
Magazine Article