Direct Measurement of Offset Spacer Effect on Carrier Profiles in Sub-50 nm p-Metal Oxide Semiconductor Field-Effect Transistors
Fukutome, Hidenobu, Saiki, Takashi, Nakamura, Ryou, Usujima, Akihiro, Aoyama, Takayuki
Published in Japanese Journal of Applied Physics (01.04.2006)
Published in Japanese Journal of Applied Physics (01.04.2006)
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