Thermal magnetic field noise limits resolution in transmission electron microscopy
Uhlemann, Stephan, Müller, Heiko, Hartel, Peter, Zach, Joachim, Haider, Max
Published in Physical review letters (22.07.2013)
Published in Physical review letters (22.07.2013)
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Journal Article
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV
Linck, Martin, Hartel, Peter, Uhlemann, Stephan, Kahl, Frank, Müller, Heiko, Zach, Joachim, Haider, Max, Niestadt, Marcel, Bischoff, Maarten, Biskupek, Johannes, Lee, Zhongbo, Lehnert, Tibor, Börrnert, Felix, Rose, Harald, Kaiser, Ute
Published in Physical review letters (12.08.2016)
Published in Physical review letters (12.08.2016)
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Journal Article
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV
Sagawa, Ryusuke, Yasuhara, Akira, Hashiguchi, Hiroki, Naganuma, Tomoyuki, Tanba, Shinichi, Ishikawa, Takaki, Riedel, Thomas, Hartel, Peter, Linck, Martin, Uhlemann, Stephan, Müller, Heiko, Sawada, Hidetaka
Published in Ultramicroscopy (01.03.2022)
Published in Ultramicroscopy (01.03.2022)
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Journal Article
A novel ground-potential monochromator design
Börrnert, Felix, Uhlemann, Stephan, Müller, Heiko, Gerheim, Volker, Haider, Maximilian
Published in Ultramicroscopy (01.11.2023)
Published in Ultramicroscopy (01.11.2023)
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Journal Article
Thermal magnetic field noise: Electron optics and decoherence
Uhlemann, Stephan, Müller, Heiko, Zach, Joachim, Haider, Max
Published in Ultramicroscopy (01.04.2015)
Published in Ultramicroscopy (01.04.2015)
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Journal Article
Advancing the Hexapole Cs-Corrector for the Transmission Electron Microscope
Riedel, Thomas, Hartel, Peter, Linck, Martin, Gerheim, Volker, Müller, Heiko, Uhlemann, Stephan
Published in Microscopy and microanalysis (01.08.2020)
Published in Microscopy and microanalysis (01.08.2020)
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Journal Article
On the Benefit of Aberration Correction in Cryo Electron Microscopy
Linck, Martin, Müller, Heiko, Hartel, Peter, Perl, Svenja, Uhlemann, Stephan, Haider, Max
Published in Microscopy and microanalysis (01.08.2020)
Published in Microscopy and microanalysis (01.08.2020)
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Journal Article
Test and Characterization of a New Post-column Imaging Energy Filter
Müller, Heiko, Linck, Martin, Schillinger, Richard, Leibscher, Angelika, Massmann, Ingo, Gerheim, Volker, Uhlemann, Stephan
Published in Microscopy and microanalysis (01.08.2020)
Published in Microscopy and microanalysis (01.08.2020)
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Journal Article
Exploiting the Full Potential of the Advanced Two-hexapole Corrector for STEM
Sagawa, Ryusuke, Yasuhara, Akira, Hashiguchi, Hiroki, Naganuma, Tomoyuki, Tanba, Shinichi, Ishikawa, Takaki, Riedel, Thomas, Hartel, Peter, Linck, Martin, Uhlemann, Stephan, Müller, Heiko, Sawada, Hidetaka
Published in Microscopy and microanalysis (01.08.2022)
Published in Microscopy and microanalysis (01.08.2022)
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Journal Article
Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope
Müller, Heiko, Uhlemann, Stephan, Hartel, Peter, Haider, Maximilian
Published in Microscopy and microanalysis (01.12.2006)
Published in Microscopy and microanalysis (01.12.2006)
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Journal Article
Aplanatic imaging systems for the transmission electron microscope
Müller, Heiko, Maßmann, Ingo, Uhlemann, Stephan, Hartel, Peter, Zach, Joachim, Haider, Maximilian
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.07.2011)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.07.2011)
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Journal Article
Advancing the Hexapole C s -Corrector for the Scanning Transmission Electron Microscope
Müller, Heiko, Uhlemann, Stephan, Hartel, Peter, Haider, Maximilian
Published in Microscopy and microanalysis (01.12.2006)
Published in Microscopy and microanalysis (01.12.2006)
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Journal Article
Overview of Commercially Available CEOS Hexapole-type Aberration Correctors
Müller, Heiko, Uhlemann, Stephan, Hartel, Peter, Zach, Joachim, Haider, Max
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Journal Article
Towards High Resolution in TEM and STEM: What are the Limitations and Achievements
Haider, Max, Uhlemann, Stephan, Hartel, Peter, Müller, Heiko
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Journal Article
A spherical-aberration-corrected 200kV transmission electron microscope
Haider, Max, Rose, Harald, Uhlemann, Stephan, Schwan, Eugen, Kabius, Bernd, Urban, Knut
Published in Ultramicroscopy (01.10.1998)
Published in Ultramicroscopy (01.10.1998)
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Journal Article
Electron microscopy image enhanced
Haider, Maximilian, Uhlemann, Stephan, Schwan, Eugen, Rose, Harald, Kabius, Bernd, Urban, Knut
Published in Nature (London) (23.04.1998)
Published in Nature (London) (23.04.1998)
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Journal Article