Inspection of Internal Bonding Wire of Semiconductor Integrated Circuit by Image Processing
AOKI, Kimiya, KANEKO, Toyohisa, SUGIURA, Fumiaki, NONOYAMA, Akio, TAMAKI, Kiyohide, UDA, Yoshimi
Published in Journal of the Japan Society for Precision Engineering, Contributed Papers (2004)
Published in Journal of the Japan Society for Precision Engineering, Contributed Papers (2004)
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