Evaluation of local strain in Si using UV-Raman spectroscopy
Ogura, Atsushi, Kosemura, Daisuke, Takei, Munehisa, Uchida, Hidetsugu, Hattori, Nobuyoshi, Yoshimaru, Masaki, Mayuzumi, Satoru, Wakabayashi, Hitoshi
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Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.03.2009)
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Journal Article
Cross-sectional transmission electron microscope studies on intrinsic breakdown spots of thin gate oxides
IKEDA, S, OKIHARA, M, UCHIDA, H, HIRASHITA, N
Published in Japanese Journal of Applied Physics (01.05.1997)
Published in Japanese Journal of Applied Physics (01.05.1997)
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INFORMATION PROCESSING METHOD, INFORMATION PROCESSING DEVICE, AND INFORMATION PROCESSING PROGRAM
MATSUYAMA Yoshihiro, HANADA Yuichi, FUNABASHI Ryoichi, UCHIDA Hidetsugu, OSAMURA Kazuki
Year of Publication 07.12.2023
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Year of Publication 07.12.2023
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