Characterization of the ultrathin HfO2 and Hf-silicate films grown by atomic layer deposition
TZE CHIANG CHEN, PENG, Cheng-Yi, TSENG, Chih-Hung, LIAO, Ming-Han, CHEN, Mei-Hsin, WU, Chih-I, CHERN, Ming-Yau, TZENG, Pei-Jer, CHEE WEE LIU
Published in IEEE transactions on electron devices (01.04.2007)
Published in IEEE transactions on electron devices (01.04.2007)
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Journal Article
Mechanism of Threshold Voltage Shift (Δ V th ) Caused by Negative Bias Temperature Instability (NBTI) in Deep Submicron pMOSFETs
Liu, Chuan-Hsi, Lee, Ming T., Lin, Chih-Yung, Chen, Jenkon, Loh, Y. T., Liou, Fu-Tai, Schruefer, Klaus, Katsetos, Anastasios A., Yang, Zhijian, Rovedo, Nivo, Hook, Terence B., Wann, Clement, Chen, Tze-Chiang
Published in Japanese Journal of Applied Physics (2002)
Published in Japanese Journal of Applied Physics (2002)
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Journal Article
Nanoscale chemical templating of Si nanowires seeded with Al
Khayyat, Maha M, Wacaser, Brent A, Reuter, Mark C, Ross, Frances M, Sadana, Devendra K, Chen, Tze-Chiang
Published in Nanotechnology (14.06.2013)
Published in Nanotechnology (14.06.2013)
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Journal Article
Challenges for silicon technology scaling in the nanoscale era
Tze-chiang Chen
Published in 2009 Proceedings of the European Solid State Device Research Conference (01.09.2009)
Published in 2009 Proceedings of the European Solid State Device Research Conference (01.09.2009)
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Conference Proceeding
Characterization of the Ultrathin \hbox and Hf-Silicate Films Grown by Atomic Layer Deposition
Chen, Tze Chiang, Peng, Cheng-Yi, Tseng, Chih-Hung, Liao, Ming-Han, Chen, Mei-Hsin, Wu, Chih-I, Chern, Ming-Yau, Tzeng, Pei-Jer, Liu, Chee Wee
Published in IEEE transactions on electron devices (01.04.2007)
Published in IEEE transactions on electron devices (01.04.2007)
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Journal Article
A 23-ps/2.1-mW ECL gate with an AC-coupled active pull-down emitter-follower stage
Kai-Yap Toh, Ching-Te Chuang, Tze-Chiang Chen, Warnock, J.D.
Published in IEEE journal of solid-state circuits (01.10.1989)
Published in IEEE journal of solid-state circuits (01.10.1989)
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Journal Article
On the temperature dependence of majority carrier transport in heavily arsenic-doped polycrystalline silicon thin films
CRESSLER, J. D, WEI HWANG, TZE-CHIANG CHEN
Published in Journal of the Electrochemical Society (01.03.1989)
Published in Journal of the Electrochemical Society (01.03.1989)
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Conference Proceeding
Journal Article
Overcoming research challenges for CMOS scaling: industry directions
Tze-Chiang Chen
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (01.10.2006)
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Conference Proceeding
On the narrow-emitter effect of advanced shallow-profile bipolar transistors
Li, G.P., Chuang, C.T., Chen, T.-C., Ning, T.H.
Published in IEEE transactions on electron devices (01.11.1988)
Published in IEEE transactions on electron devices (01.11.1988)
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Journal Article
Design considerations of high-performance narrow-emitter bipolar transistors
Tang, D.D., Tze-Chiang Chen, Ching-Te Chuang, Li, G.P., Stork, J.M.C., Ketchen, M.B., Hackbarth, E., Ning, T.H.
Published in IEEE electron device letters (01.04.1987)
Published in IEEE electron device letters (01.04.1987)
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Journal Article
Innovation in solid state devices for exascale computing
Tze-chiang Chen
Published in Proceedings of 2010 International Symposium on VLSI Technology, System and Application (01.04.2010)
Published in Proceedings of 2010 International Symposium on VLSI Technology, System and Application (01.04.2010)
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Conference Proceeding
Sub-300-ps CBL circuits
Widemann, S.K., Chen, T.-C., Chuang, C.-T., Heuber, K., Wendel, D.F., Warnock, J., Li, G.P., Chin, K., Ning, T.H.
Published in IEEE electron device letters (01.11.1989)
Published in IEEE electron device letters (01.11.1989)
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Journal Article
Bipolar transistor with self-aligned lateral profile
Li, G.P., Tze-Chiang Chen, Ching-Te Chuang, Stork, J.M.C., Tang, D.D., Ketchen, M.B., Li-Kong Wang
Published in IEEE electron device letters (01.08.1987)
Published in IEEE electron device letters (01.08.1987)
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Journal Article