True 3D Nanometrology: 3D-Probing with a Cantilever-Based Sensor
Thiesler, Jan, Ahbe, Thomas, Tutsch, Rainer, Dai, Gaoliang
Published in Sensors (Basel, Switzerland) (31.12.2021)
Published in Sensors (Basel, Switzerland) (31.12.2021)
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Journal Article
Speckle reduction for a laser light sectioning sensor
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Journal Article
Conference Proceeding
Correction method for 3D non-linear drift distortions in atomic force microscopy raster measurements
Degenhardt, Johannes, Tutsch, Rainer, Dai, Gaoliang
Published in Measurement science & technology (01.02.2023)
Published in Measurement science & technology (01.02.2023)
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Journal Article
Flexible correction of 3D non-linear drift in SPM measurements by data fusion
Degenhardt, Johannes, Tutsch, Rainer, Dai, Gaoliang
Published in Measurement science & technology (01.03.2021)
Published in Measurement science & technology (01.03.2021)
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Journal Article
Novel hybrid interference and atomic force microscopy
Dai, Gaoliang, Jiao, Ziyang, Rao, Xingyu, Wolff, Helmut, Tutsch, Rainer
Published in Measurement science & technology (03.09.2024)
Published in Measurement science & technology (03.09.2024)
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Journal Article
Tip wear and tip breakage in high-speed atomic force microscopes
Strahlendorff, Timo, Dai, Gaoliang, Bergmann, Detlef, Tutsch, Rainer
Published in Ultramicroscopy (01.06.2019)
Published in Ultramicroscopy (01.06.2019)
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Journal Article
Systematische Simulationsmethode zur effizienten Abschätzung von Unsicherheiten komplexer Messungen – ein Zwischenweg von klassischem GUM und der Monte-Carlo Methode: Systematic simulation method for efficient estimation of uncertainties of complex measurements - an intermediate approach between classical GUM and the Monte-Carlo method
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Journal Article
A feasibility study towards traceable calibration of size and form of microspheres by stitching AFM images using ICP point-to-plane algorithm
Dai, Gaoliang, Degenhardt, Johannes, Hu, Xiukun, Wolff, Helmut, Tutsch, Rainer, Manske, Eberhard
Published in Measurement science & technology (01.05.2023)
Published in Measurement science & technology (01.05.2023)
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Journal Article
True 3D-AFM sensor for nanometrology
Thiesler, Jan, Tutsch, Rainer, Fromm, Karsten, Dai, Gaoliang
Published in Measurement science & technology (01.07.2020)
Published in Measurement science & technology (01.07.2020)
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Journal Article
On the importance of multi-material acceptance testing for CT-based CMSs
Borges de Oliveira, Fabrício, Bartscher, Markus, Neuschaefer-Rube, Ulrich, Hiller, Jochen, Tutsch, Rainer
Published in Precision engineering (01.07.2023)
Published in Precision engineering (01.07.2023)
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Journal Article
A New Kind of Atomic Force Microscopy Scan Control Enabled by Artificial Intelligence: Concept for Achieving Tip and Sample Safety Through Asymmetric Control
Degenhardt, Johannes, Bounaim, Mohammed Wassim, Deng, Nan, Tutsch, Rainer, Dai, Gaoliang
Published in Nanomanufacturing and metrology (01.12.2024)
Published in Nanomanufacturing and metrology (01.12.2024)
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Journal Article