RHA Implications of Proton on Gold-Plated Package Structures in SEE Evaluations
Turflinger, T. L., Clymer, D. A., Mason, L. W., Stone, S., George, J. S., Savage, M., Koga, R., Beach, E., Huntington, K.
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Proton on Metal Fission Environments in an IC Package: An RHA Evaluation Method
Turflinger, T. L., Clymer, D. A., Mason, L. W., Stone, S., George, J. S., Koga, R., Beach, E., Huntington, K.
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Journal Article
Response Variability in Commercial MOSFET SEE Qualification
George, J. S., Clymer, D. A., Turflinger, T. L., Mason, L. W., Stone, S., Koga, R., Beach, E., Huntington, K., Lauenstein, J-M, Titus, J., Sivertz, M.
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Journal Article
Frequency domain analysis of analog single-event transients in linear circuits
Boulghassoul, Y., Massengill, L.W., Turflinger, T.L., Holman, W.T.
Published in IEEE transactions on nuclear science (01.12.2002)
Published in IEEE transactions on nuclear science (01.12.2002)
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Journal Article
ELDRS in space: an updated and expanded analysis of the bipolar ELDRS experiment on MPTB
Turflinger, T.L., Campbell, A.B., Schmeichel, W.M., Walters, R.J., Krieg, J.F., Titus, J.L., Reeves, M., Marshall, P.W., Pease, R.L.
Published in IEEE transactions on nuclear science (01.12.2003)
Published in IEEE transactions on nuclear science (01.12.2003)
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Journal Article
Total-dose hardening of a bipolar-voltage comparator
Pease, R.L., Maher, M.C., Shaneyfelt, M.R., Savage, M.W., Baker, P., Krieg, J., Turflinger, T.L.
Published in IEEE transactions on nuclear science (01.12.2002)
Published in IEEE transactions on nuclear science (01.12.2002)
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Journal Article
Digital Device Error Rate Trends in Advanced CMOS Technologies
Gadlage, M.J., Eaton, P.H., Benedetto, J.M., Carts, M., Vivian Zhu, Turflinger, T.L.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
First observations of enhanced low dose rate sensitivity (ELDRS) in space: One part of the MPTB experiment
Titus, J.L., Combs, W.E., Turflinger, T.L., Krieg, J.F., Tausch, H.J., Brown, D.B., Pease, R.L., Campbell, A.B.
Published in IEEE transactions on nuclear science (01.12.1998)
Published in IEEE transactions on nuclear science (01.12.1998)
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Journal Article
Single event effects in analog-to-digital converters: device performance and system impact
Turflinger, T.L., Davey, M.V., Mappes, B.M.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
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Journal Article
Conference Proceeding
A comprehensive analog single-event transient analysis methodology
Savage, M.W., Titus, J.L., Turflinger, T.L., Pease, R.L., Poivey, C.
Published in IEEE transactions on nuclear science (01.12.2004)
Published in IEEE transactions on nuclear science (01.12.2004)
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Journal Article
A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment
Pease, R.L., Cohn, L.M., Fleetwood, D.M., Gehlhausen, M.A., Turflinger, T.L., Brown, D.B., Johnston, A.H.
Published in IEEE transactions on nuclear science (01.12.1997)
Published in IEEE transactions on nuclear science (01.12.1997)
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Journal Article
Response Variability in Commercial MOSFET SEE Qualification
George, J. S., Clymer, D. A., Turflinger, T. L., Mason, L. W., Stone, S., Koga, R., Beach, E., Huntington, K., Lauenstein, J. -M., Titus, J., Sivertz, M.
Published in IEEE transactions on nuclear science (01.12.2016)
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Published in IEEE transactions on nuclear science (01.12.2016)
Journal Article
Understanding single event phenomena in complex analog and digital integrated circuits
Turflinger, T.L., Davey, M.V.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
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Journal Article
Conference Proceeding
Transient radiation test techniques for high-speed analog-to-digital converters
Turflinger, T.L., Davey, M.V.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1989)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1989)
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Journal Article
Conference Proceeding
Single event transient pulse widths in digital microcircuits
Gadlage, M.J., Schrimpf, R.D., Benedetto, J.M., Eaton, P.H., Mavis, D.G., Sibley, M., Avery, K., Turflinger, T.L.
Published in IEEE transactions on nuclear science (01.12.2004)
Published in IEEE transactions on nuclear science (01.12.2004)
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Journal Article
Current single event effects and radiation damage results for candidate spacecraft electronics
O'Bryan, M.V., LaBel, K.A., Ladbury, R.L., Poivey, C., Howard, J.W., Reed, R.A., Kniffin, S.D., Buchner, S.P., Bings, J.P., Titus, J.L., Clark, S.D., Turflinger, T.L., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Jones, M.R., Sanders, A.B., Irwin, T.L., Cox, S.R., Kahric, Z.A., Palor, C.D., Sciarini, J.A.
Published in IEEE Radiation Effects Data Workshop (2002)
Published in IEEE Radiation Effects Data Workshop (2002)
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Conference Proceeding