Substitutionality of nitrogen atoms and formation of nitrogen complexes and point defects in GaPN alloys
Jussila, H, Yu, K M, Kujala, J, Tuomisto, F, Nagarajan, S, Lemettinen, J, Huhtio, T, Tuomi, T O, Lipsanen, H, Sopanen, M
Published in Journal of physics. D, Applied physics (19.02.2014)
Published in Journal of physics. D, Applied physics (19.02.2014)
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Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge
Lankinen, A., Knuuttila, L., Kostamo, P., Tuomi, T.O., Lipsanen, H., McNally, P.J., O’Reilly, L.
Published in Journal of crystal growth (01.11.2009)
Published in Journal of crystal growth (01.11.2009)
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X-ray diffraction study of GaN grown on patterned substrates
Sintonen, S., Ali, M., Törmä, P. T., Suihkonen, S., Kostamo, P., Svensk, O., Sopanen, M., Lipsanen, H., Paulmann, C., Tuomi, T. O.
Published in Physica status solidi. C (01.05.2011)
Published in Physica status solidi. C (01.05.2011)
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In-situ optical reflectance and synchrotron X-ray topography study of defects in epitaxial dilute GaAsN on GaAs
Reentilä, O., Lankinen, A., Mattila, M., Säynätjoki, A., Tuomi, T. O., Lipsanen, H., O’Reilly, L., McNally, P. J.
Published in Journal of materials science. Materials in electronics (01.02.2008)
Published in Journal of materials science. Materials in electronics (01.02.2008)
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Conference Proceeding
Femtosecond versus nanosecond laser micro-machining of InP: a nondestructive three-dimensional analysis of strain
Xu, Lu, Lowney, Donnacha, McNally, Patrick J, Borowiec, A, Lankinen, A, Tuomi, T O, Danilewsky, A N
Published in Semiconductor science and technology (01.08.2007)
Published in Semiconductor science and technology (01.08.2007)
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Raman scattering studies of ultrashallow Sb implants in strained Si
O’Reilly, L., Bennett, N. S., McNally, P. J., Sealy, B. J., Cowern, N. E. B., Lankinen, A., Tuomi, T. O.
Published in Journal of materials science. Materials in electronics (01.04.2008)
Published in Journal of materials science. Materials in electronics (01.04.2008)
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Conference Proceeding
Dislocations at the interface between sapphire and GaN
Lankinen, A., Lang, T., Suihkonen, S., Svensk, O., Säynätjoki, A., Tuomi, T. O., McNally, P. J., Odnoblyudov, M., Bougrov, V., Danilewsky, A. N., Bergman, P., Simon, R.
Published in Journal of materials science. Materials in electronics (01.02.2008)
Published in Journal of materials science. Materials in electronics (01.02.2008)
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Evaluation of critical thickness of GaP0.98N0.02 layer on GaP substrate by synchrotron X-ray diffraction topography
Jussila, H., Nagarajan, S., Sintonen, S., Suihkonen, S., Lankinen, A., Huhtio, T., Paulmann, C., Lipsanen, H., Tuomi, T.O., Sopanen, M.
Published in Thin solid films (01.05.2013)
Published in Thin solid films (01.05.2013)
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Anisotropic surface structure in ordered strained InGaP
Hasenöhrl, S, Kúdela, R, Novák, J, Tuomi, T.O, Knuuttila, L
Published in Materials science & engineering. B, Solid-state materials for advanced technology (16.01.2002)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (16.01.2002)
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Conference Proceeding
Long-term follow-up of hexamethylene diisocyanate-, diphenylmethane diisocyanate-, and toluene diisocyanate-induced asthma
PIIRILÄ, P. L, NORDMAN, H, KESKINEN, H. M, LUUKKONEN, R, SALO, S.-P, TUOMI, T. O, TUPPURAINEN, M
Published in American journal of respiratory and critical care medicine (01.08.2000)
Published in American journal of respiratory and critical care medicine (01.08.2000)
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Structural and electrical characterisation of ion-implanted strained silicon
Horan, K., Lankinen, A., O’Reilly, L., Bennett, N.S., McNally, P.J., Sealy, B.J., Cowern, N.E.B., Tuomi, T.O.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2008)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2008)
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Synchrotron X-ray diffraction topography study of bonding-induced strain in silicon-on-insulator wafers
Lankinen, A., Tuomi, T.O., Kostamo, P., Jussila, H., Sintonen, S., Lipsanen, H., Tilli, M., Mäkinen, J., Danilewsky, A.N.
Published in Thin solid films (31.03.2016)
Published in Thin solid films (31.03.2016)
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X-ray excited optical luminescence of Mg-doped GaN
Lankinen, A., Svensk, O., Mattila, M., Tuomi, T.O., Lipsanen, H., McNally, P.J., O'Reilly, L., Paulmann, C.
Published in Journal of X-ray science and technology (2008)
Published in Journal of X-ray science and technology (2008)
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