A Compact Statistical Model for the Low-Frequency Noise in Halo-Implanted MOSFETs: Large RTN Induced by Halo Implants
Banaszeski da Silva, Mauricio, Both, Thiago H., Tuinhout, Hans P., Zegers-van Duijnhoven, Adrie, Wirth, Gilson I., Scholten, Andries J.
Published in IEEE transactions on electron devices (01.08.2019)
Published in IEEE transactions on electron devices (01.08.2019)
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Journal Article
Autocorrelation Analysis as a Technique to Study Physical Mechanisms of MOSFET Low-Frequency Noise
Both, Thiago H., Croon, Jeroen A., Banaszeski da Silva, Mauricio, Tuinhout, Hans P., Scholten, Andries J., Zegers-van Duijnhoven, Adrie, Wirth, Gilson I.
Published in IEEE transactions on electron devices (01.07.2017)
Published in IEEE transactions on electron devices (01.07.2017)
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Journal Article
Characterization and Modeling of Hot Carrier-Induced Variability in Subthreshold Region
Magnone, P., Crupi, F., Wils, N., Tuinhout, H. P., Fiegna, C.
Published in IEEE transactions on electron devices (01.08.2012)
Published in IEEE transactions on electron devices (01.08.2012)
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Journal Article
Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies
Magnone, P., Crupi, F., Wils, N., Jain, R., Tuinhout, H., Andricciola, P., Giusi, G., Fiegna, C.
Published in IEEE transactions on electron devices (01.08.2011)
Published in IEEE transactions on electron devices (01.08.2011)
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Journal Article
Characterization of STI Edge Effects on CMOS Variability
Wils, N., Tuinhout, H.P., Meijer, M.
Published in IEEE transactions on semiconductor manufacturing (01.02.2009)
Published in IEEE transactions on semiconductor manufacturing (01.02.2009)
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Journal Article
Test Structures for studying the impact of the backend contact metallization on the performance and stress sensitivity of SiGe HBTs
Dieball, Oliver, Tuinhout, Hans, Zaal, Jeroen
Published in 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) (15.04.2024)
Published in 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) (15.04.2024)
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Conference Proceeding
Characterization of systematic MOSFET current factor mismatch caused by metal CMP dummy structures
Tuinhout, H.P., Vertregt, M.
Published in IEEE transactions on semiconductor manufacturing (01.11.2001)
Published in IEEE transactions on semiconductor manufacturing (01.11.2001)
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Journal Article
Conference Proceeding
Characterization of matching variability and low-frequency noise for mixed-signal technologies
Tuinhout, Hans
Published in Proceedings of the IEEE 2013 Custom Integrated Circuits Conference (01.09.2013)
Published in Proceedings of the IEEE 2013 Custom Integrated Circuits Conference (01.09.2013)
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Conference Proceeding
Analog circuits in ultra-deep-submicron CMOS
Annema, A.-J., Nauta, B., van Langevelde, R., Tuinhout, H.
Published in IEEE journal of solid-state circuits (01.01.2005)
Published in IEEE journal of solid-state circuits (01.01.2005)
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Journal Article
Conference Proceeding
Design and use of an array-based test structure to characterize mechanical stress effects caused by WLCSP solder bumps
Tuinhout, Hans, van Dalen, Rob
Published in 2016 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2016)
Published in 2016 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2016)
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Conference Proceeding
Journal Article
Design and characterization of a high-precision resistor ladder test structure
Tuinhout, H.P., Hoogzaad, G., Vertregt, M., Roovers, R.L.J., Erdmann, C.
Published in IEEE transactions on semiconductor manufacturing (01.05.2003)
Published in IEEE transactions on semiconductor manufacturing (01.05.2003)
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Journal Article
Conference Proceeding
Parametric Mismatch Characterization for Mixed-Signal Technologies
Tuinhout, Hans, Wils, Nicole, Andricciola, Pietro
Published in IEEE journal of solid-state circuits (01.09.2010)
Published in IEEE journal of solid-state circuits (01.09.2010)
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Journal Article
A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping
Banaszeski da Silva, Mauricio, Tuinhout, Hans P., Zegers-van Duijnhoven, Adrie, Wirth, Gilson I., Scholten, Andries J.
Published in IEEE transactions on electron devices (01.08.2017)
Published in IEEE transactions on electron devices (01.08.2017)
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Journal Article
A physics-based RTN variability model for MOSFETs
Banaszeski da Silva, Mauricio, Tuinhout, Hans, Zegers-van Duijnhoven, Adrie, Wirth, Gilson I., Scholten, Andries
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
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Conference Proceeding