Berkeley reliability tools-BERT
Tu, R.H., Rosenbaum, E., Chan, W.Y., Li, C.C., Minami, E., Quader, K., Ko, P.K., Hu, C.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.1993)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.1993)
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Journal Article
An AC conductance technique for measuring self-heating in SOI MOSFET's
Tu, R.H., Wann, C., King, J.C., Ko, P.K., Chenming Hu
Published in IEEE electron device letters (01.02.1995)
Published in IEEE electron device letters (01.02.1995)
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Journal Article
Expressive Cartography, Boundary Objects and the Aesthetics of Public Visualization
Dávila, Patricio, Colangelo, Dave, Chan, Maggie, Tu, Robert
Published in Leonardo (Oxford) (01.10.2017)
Published in Leonardo (Oxford) (01.10.2017)
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Journal Article
Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection
Vyas, Pratik B., Pimparkar, Ninad, Tu, Robert, Arfaoui, Wafa, Bossu, Germain, Siddabathula, Mahesh, Lehmann, Steffen, Goo, Jung-Suk, Icel, Ali B.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
A complete radiation reliability software simulator
Pavan, P., Tu, R.H., Minami, E.R., Lum, G., Ko, P.K., Chenming Hu
Published in IEEE transactions on nuclear science (01.12.1994)
Published in IEEE transactions on nuclear science (01.12.1994)
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Journal Article
Conference Proceeding
Simulating process-induced gate oxide damage in circuits
Tu, R., King, J.C., Hyungcheol Shin, Chenming Hu
Published in IEEE transactions on electron devices (01.09.1997)
Published in IEEE transactions on electron devices (01.09.1997)
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Journal Article
AC output conductance of SOI MOSFETs and impact on analog applications
Sinitsky, D., Tu, R., Chunlin Liang, Chan, Mansun, Bokor, J., Chenming Hu
Published in IEEE electron device letters (01.02.1997)
Published in IEEE electron device letters (01.02.1997)
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Journal Article
A bidirectional NMOSFET current reduction model for simulation of hot-carrier-induced circuit degradation
Quader, K.N., Li, C.C., Tu, R., Rosenbaum, E., Ko, P.K., Chenming Hu
Published in IEEE transactions on electron devices (01.12.1993)
Published in IEEE transactions on electron devices (01.12.1993)
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Journal Article
MOSFET saturation voltage
Tu, Robert, Huang, Jian-Hui, Ko, Ping, Hu, Chenming
Published in Solid-state electronics (01.07.1994)
Published in Solid-state electronics (01.07.1994)
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Journal Article
Simulating radiation reliability with BERT
Pavan, Paolo, Tu, Robert, Minami, Eric, Lum, Gary, Ko, Ping K., Hu, Chenming
Published in Microelectronics (01.09.1995)
Published in Microelectronics (01.09.1995)
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Journal Article
A new approach for simulation of circuit degradation due to hot-electron damage in NMOSFETs
Quader, K.N., Li, C., Tu, R., Rosenbaum, E., Ko, P., Hu, C.
Published in International Electron Devices Meeting 1991 [Technical Digest] (1991)
Published in International Electron Devices Meeting 1991 [Technical Digest] (1991)
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Conference Proceeding
Simulating total-dose radiation effects on circuit behavior
Tu, R., Lum, G., Pavan, P., Ping Ko, Chenming Hu
Published in Proceedings of 1994 IEEE International Reliability Physics Symposium (1994)
Published in Proceedings of 1994 IEEE International Reliability Physics Symposium (1994)
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Conference Proceeding
Analogos de acidos grasos o acidos grasos triglicerido o sal de estos, que pueden comprender al menos un radioisotopo de emision de positrones; procedimiento de preparacion; metodo para determinar la distribucion de acido graso o trigliceridos mediante la exploracion por tomografia por emision de positrones (pet)
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Patent