An Accurate Timing-Aware Diagnosis Algorithm for Multiple Small Delay Defects
Po-Juei Chen, Wei-Li Hsu, Li, James C.-M, Nan-Hsin Tseng, Kuo-Yin Chen, Wei-pin Changchien, Liu, Charles C. C.
Published in 2011 Asian Test Symposium (01.11.2011)
Published in 2011 Asian Test Symposium (01.11.2011)
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Conference Proceeding
Integrated circuit comprising buffer chain
Chen Chien-Hui, Changchien Wei-Pin, Tseng Nan-Hsin, Chien Chin-Her, Chuang Yi-Lin
Year of Publication 25.10.2016
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Year of Publication 25.10.2016
Patent