Fault-Aware ECC Techniques for Reliability Enhancement of Flash Memory
Lu, Shyue-Kung, Tsai, Zeng-Long, Hsu, Chun-Lung, Sun, Chi-Tien
Published in 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (01.08.2020)
Published in 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (01.08.2020)
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Conference Proceeding
ECC Caching Techniques for Protecting NAND Flash Memories
Lu, Shyue-Kung, Tsai, Zeng-Long, Hsu, Chun-Lung, Sun, Chi-Tien
Published in 2020 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2020)
Published in 2020 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2020)
Get full text
Conference Proceeding