Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique
Tsai, Du-ming, Hsieh, Yi-chun
Published in IEEE transactions on instrumentation and measurement (01.11.2017)
Published in IEEE transactions on instrumentation and measurement (01.11.2017)
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Journal Article
Fast and Precise Positioning in PCBs Using Deep Neural Network Regression
Tsai, Du-Ming, Chou, Yi-Hsiang
Published in IEEE transactions on instrumentation and measurement (01.07.2020)
Published in IEEE transactions on instrumentation and measurement (01.07.2020)
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Journal Article
Watermark Detection in CMOS Image Sensors Using Cosine-Convolutional Semantic Networks
Solorzano, Carlos, Tsai, Du-Ming
Published in IEEE transactions on semiconductor manufacturing (01.05.2023)
Published in IEEE transactions on semiconductor manufacturing (01.05.2023)
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Journal Article
Defect detection of solar cells in electroluminescence images using Fourier image reconstruction
Tsai, Du-Ming, Wu, Shih-Chieh, Li, Wei-Chen
Published in Solar energy materials and solar cells (01.04.2012)
Published in Solar energy materials and solar cells (01.04.2012)
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Journal Article
Defect Detection in Solar Modules Using ICA Basis Images
Tsai, Du-Ming, Wu, Shih-Chieh, Chiu, Wei-Yao
Published in IEEE transactions on industrial informatics (01.02.2013)
Published in IEEE transactions on industrial informatics (01.02.2013)
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Journal Article
Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing
Fan, Shu-Kai S., Hsu, Chia-Yu, Tsai, Du-Ming, Chou, Mabel C., Jen, Chih-Hung, Tsou, Jen-Hsuan
Published in IEEE transactions on automation science and engineering (01.07.2022)
Published in IEEE transactions on automation science and engineering (01.07.2022)
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Journal Article
Self assured Deep Learning with Minimum Pre Labeled Data for Wafer Pattern Classification
Fan, Shu-Kai S., Tsai, Du-Ming, Shih, Ya-Fang
Published in IEEE transactions on semiconductor manufacturing (01.08.2023)
Published in IEEE transactions on semiconductor manufacturing (01.08.2023)
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Journal Article
Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques
Fan, Shu-Kai S., Tsai, Du-Ming, He, Fei, Huang, Jui-Yu, Jen, Chih-Hung
Published in IEEE transactions on semiconductor manufacturing (01.11.2019)
Published in IEEE transactions on semiconductor manufacturing (01.11.2019)
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Journal Article
Data Visualization of Anomaly Detection in Semiconductor Processing Tools
Fan, Shu-Kai S., Tsai, Du-Ming, Jen, Chih-Hung, Hsu, Chia-Yu, He, Fei, Juan, Li-Ting
Published in IEEE transactions on semiconductor manufacturing (01.05.2022)
Published in IEEE transactions on semiconductor manufacturing (01.05.2022)
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Journal Article
A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection
Tsai, Du-Ming, Chiang, I-Yung, Tsai, Ya-Hui
Published in IEEE transactions on industrial informatics (01.02.2012)
Published in IEEE transactions on industrial informatics (01.02.2012)
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Journal Article