Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate
Neves, BR, Salmon, ME, Russell, PE, Troughton, Jr, EB
Published in Microscopy and microanalysis (01.11.1999)
Published in Microscopy and microanalysis (01.11.1999)
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